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The IEEE International Workshop on Defect and Fault Tolerance in Vlsi Systems: Proceedings : November 13-15, 1995 Lafayette, Louisiana
  
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The IEEE International Workshop on Defect and Fault Tolerance in Vlsi Systems: Proceedings : November 13-15, 1995 Lafayette, Louisiana [Hardcover]

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Corporate Author)
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Product Details

  • Hardcover: 305 pages
  • Publisher: IEEE Computer Society Press (November 1995)
  • Language: English
  • ISBN-10: 0818671076
  • ISBN-13: 978-0818671074
  • Product Dimensions: 9.5 x 6.5 x 1 inches
  • Shipping Weight: 1.4 pounds
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