Surface analysis--the examination of the outer few nanometers of a material--is a routine undertaking in laboratories throughout the world, and is of great importance in such areas as corrosion, adhesion, polymer surface treatment, and microelectronics fabrication. This handbook provides an introduction to the two most popular surface analysis techniques: X-ray photoelectron spectroscopy and Auger electron spectroscopy. It explains the underlying physical principles, discusses instrumentation, and looks at the interpretation of resulting spectra. Applications of the two techniques are considered, and a critical comparison with other available methods is also included. This fully illustrated guide will be a valuable introduction for students and researchers in physics, engineering, and materials science.
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Book Description
Editorial Reviews
From the Back Cover
An Introduction to Surface Analysis by Electron Spectroscopy is a clear and accessible introduction to the key spectroscopic techniques used in surface analysis. Focusing on the two most popular surface science techniques; X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES), the book will be of benefit to both students and users in industry who require a rapid grounding in the methods before carrying out their own analysis.
Starting with an introduction to the basic concepts of electron spectroscopy, the text moves on to explain underlying physical principles, discusses the instrumentation employed and looks at the interpretation of the resulting spectra. The latest material on angle resolved XPS, surface engineering and complimentary methods have been included to provide an up-to-date account of these widely used techniques.
An Introduction to Surface Analysis by Electron Spectroscopy:
* is a readily accessible introduction to the key spectroscopic techniques in surface analysis.
* provides descriptions of the latest instruments and techniques.
* includes a detailed glossary of key surface analysis terms.
An invaluable text for both undergraduate and postgraduate students taking courses on materials, analysis and surface science. The book will also be a useful reference to those newcomers to surface science wishing to familiarise themselves with the necessary techniques. --This text refers to an out of print or unavailable edition of this title.
Starting with an introduction to the basic concepts of electron spectroscopy, the text moves on to explain underlying physical principles, discusses the instrumentation employed and looks at the interpretation of the resulting spectra. The latest material on angle resolved XPS, surface engineering and complimentary methods have been included to provide an up-to-date account of these widely used techniques.
An Introduction to Surface Analysis by Electron Spectroscopy:
* is a readily accessible introduction to the key spectroscopic techniques in surface analysis.
* provides descriptions of the latest instruments and techniques.
* includes a detailed glossary of key surface analysis terms.
An invaluable text for both undergraduate and postgraduate students taking courses on materials, analysis and surface science. The book will also be a useful reference to those newcomers to surface science wishing to familiarise themselves with the necessary techniques. --This text refers to an out of print or unavailable edition of this title.
About the Author
John F Watts is Professor of Adhesion Science in the School of Engineering at the Unversity Surrey. He currently leads a Research Group applying surface analysis methods to investigations in materials science and is Editor-in-Chief of the Wiley journal Surface and Interface Analysis.
John Wolstenholme is Marketing Manager at Thermo VG Scientific. With a background in SIMS, he has been actively involved in XPS and AES for the last twelve years. --This text refers to an alternate Paperback edition.
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5.0 out of 5 stars
So practical,
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This review is from: An Introduction to Surface Analysis by XPS and AES (Paperback)
This is so useful for XPS operators and those who want to analyze XPS and AES spectra. In terms that there are not many recent books concerning thses topics, this is valuable and excellent book for surface scientists and engineers.
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First Sentence:
All solid materials interact with their surroundings through their surfaces. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
retard ratio, chemical state information, electron energy analyser, compositional depth profiling, transfer lens, compositional depth profile, specimen kindly, primary beam energy, photoelectron peak, parallel acquisition, electron spectrometer, sputter yield, electron spectroscopy, peak fitting, field emission source, survey spectrum, ion gun, pass energy, flow agent, attenuation length, field emitter, depth resolution, surface segregation, electron spectra, resultant spectrum Key Phrases - Capitalized Phrases (CAPs): (learn more)
John Wiley, Sons Limited, Elsevier Science, National Physical Laboratory New!
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Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
All solid materials interact with their surroundings through their surfaces. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
retard ratio, chemical state information, electron energy analyser, compositional depth profiling, transfer lens, compositional depth profile, specimen kindly, primary beam energy, photoelectron peak, parallel acquisition, electron spectrometer, sputter yield, electron spectroscopy, peak fitting, field emission source, survey spectrum, ion gun, pass energy, flow agent, attenuation length, field emitter, depth resolution, surface segregation, electron spectra, resultant spectrum Key Phrases - Capitalized Phrases (CAPs): (learn more)
John Wiley, Sons Limited, Elsevier Science, National Physical Laboratory New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
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10
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- Surface Analysis: The Principal Techniques by John C. Vickerman in Back Matter
- Soil Analysis by J. Gautheyrou on page 155
- Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications by Henning Bubert in Back Matter
- Industrial Metrology by Graham T. Smith on page 134
- Surface Modification and Mechanisms: Friction, Stress, and Reaction Engineering by George E. Totten on page 500
- Surface Science Techniques by J.M. Walls on page 23
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