Introduction to Semiconductor Device Yield Modeling addresses the economic need for accurate yield prediction and clarifies the important role it plays in the semiconductor industry. Supported by over 225 equations, 18 figures, and 64 references.
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5.0 out of 5 stars
excellent for physicists,
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This review is from: Introduction to Semiconductor Device Yield Modeling (Artech House Materials Science Library) (Hardcover)
It's a slim volume that says alot. It gives the basic foundation of yield estimation and statistics required. It speaks to a physicist.
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Inside This Book
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First Sentence:
This chapter explains what yield means and why it is important to be able to predict it accurately. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
binomial yield equation, minimum design dimension, accurate yield predictions, sensitivity scale factor, miscellaneous defects, area scale factor, fault probability, array segments, yield modeling, leakage faults, peripheral circuitry, cumulative yield, mask level, fatal defects, random defects, defect density, reference product, device yield, test chips, net yield, predicted yield, proposed product Key Phrases - Capitalized Phrases (CAPs): (learn more)
Electron Devices, Plenum Press, Role of Defect Size Distribution, Semiconductor Manufacturing, Electrical Engineering, John Wiley, Microelectronics Journal, Solid State Technology New!
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Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
This chapter explains what yield means and why it is important to be able to predict it accurately. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
binomial yield equation, minimum design dimension, accurate yield predictions, sensitivity scale factor, miscellaneous defects, area scale factor, fault probability, array segments, yield modeling, leakage faults, peripheral circuitry, cumulative yield, mask level, fatal defects, random defects, defect density, reference product, device yield, test chips, net yield, predicted yield, proposed product Key Phrases - Capitalized Phrases (CAPs): (learn more)
Electron Devices, Plenum Press, Role of Defect Size Distribution, Semiconductor Manufacturing, Electrical Engineering, John Wiley, Microelectronics Journal, Solid State Technology New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 10
books:
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7
books
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- Probability, Random Variables and Stochastic Processes with Errata Sheet by Athanasios Papoulis on page 33
- Materials Handbook for Hybrid Microelectronics (Materials Series) by Joseph A. King in Front Matter
- A30.5 Integrated Circuits Video by Thomson Delmar Learning on page 20
- Electrical and Magnetic Properties of Materials (Artech House Materials Science Library) by Philippe Robert in Front Matter
- Probability and Statistics by Athanasios Papoulis on page 33
See all 10 books this book cites
- Integrated Circuit Manufacturability: The Art of Process and Design Integration by Jose Pineda de Gyvez on page 81, and page 150
- Principles and Analysis of Aigaas/Gaas Heterojuntion Bipolar Transistors (Solid State Technology) by Juin J. Liou in Front Matter
- Understanding Semiconductor Devices (Oxford Series in Electrical and Computer Engineering) by Sima Dimitrijev in Back Matter
- Flip Chip Technologies by John H. Lau on page 521
- Computational Modeling in Semiconductor Processing (The Artech House Materials Science Library) by M. Meyyappan in Front Matter
See all 7 books citing this book
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