An Introduction to Surface Analysis by XPS and AES [Paperback]

John F. Watts (Author), John Wolstenholme (Author)

Book Description

Publication Date: May 26, 2003 | ISBN-10: 0470847131 | ISBN-13: 978-0470847138 | Edition: 2nd

Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods.
* Includes an accessible introduction to the key spectroscopic techniques in surface analysis.
* Provides descriptions of latest instruments and techniques.
* Includes a detailed glossary of key surface analysis terms.

Editorial Reviews

From the Back Cover

An Introduction to Surface Analysis by Electron Spectroscopy is a clear and accessible introduction to the key spectroscopic techniques used in surface analysis. Focusing on the two most popular surface science techniques; X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES), the book will be of benefit to both students and users in industry who require a rapid grounding in the methods before carrying out their own analysis.

Starting with an introduction to the basic concepts of electron spectroscopy, the text moves on to explain underlying physical principles, discusses the instrumentation employed and looks at the interpretation of the resulting spectra. The latest material on angle resolved XPS, surface engineering and complimentary methods have been included to provide an up-to-date account of these widely used techniques.

• Examples taken from the fields of metallurgy, corrosion, microelectronics, polymers and adhesion.
• Detailed glossary of key surface analysis terms.
• An invaluable text for undergraduate and postgraduate students studying surface analysis within science and engineering.
• A useful reference to those working within the field and needing to familiarize themselves with these important techniques.

About the Author

John F Watts is Professor of Adhesion Science in the School of Engineering at the Unversity Surrey.  He currently leads a Research Group applying surface analysis methods to investigations in materials science and is Editor-in-Chief of the Wiley journal Surface and Interface Analysis.

John Wolstenholme is Marketing Manager at Thermo VG Scientific.  With a background in SIMS, he has been actively involved in XPS and AES for the last twelve years.

Product Details

• Paperback: 224 pages
• Publisher: Wiley; 2nd edition (May 26, 2003)
• Language: English
• ISBN-10: 0470847131
• ISBN-13: 978-0470847138
• Product Dimensions: 9 x 6.1 x 0.6 inches
• Shipping Weight: 14.9 ounces (View shipping rates and policies)
• Average Customer Review: 5.0 out of 5 stars  See all reviews (1 customer review)
• Amazon Best Sellers Rank: #1,482,363 in Books (See Top 100 in Books)

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5.0 out of 5 stars So practical, December 14, 2009

By 

Jeong Won Kim - See all my reviews
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This review is from: An Introduction to Surface Analysis by XPS and AES (Paperback)

This is so useful for XPS operators and those who want to analyze XPS and AES spectra. In terms that there are not many recent books concerning thses topics, this is valuable and excellent book for surface scientists and engineers.