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Journey to Data Quality Hardcover – October 1, 2006


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Product Details

  • Hardcover: 240 pages
  • Publisher: The MIT Press (October 1, 2006)
  • Language: English
  • ISBN-10: 0262122871
  • ISBN-13: 978-0262122870
  • Product Dimensions: 0.6 x 6 x 9 inches
  • Shipping Weight: 13.6 ounces
  • Amazon Best Sellers Rank: #2,195,616 in Books (See Top 100 in Books)

Editorial Reviews

Review

"The issue of data quality has become increasingly important over the last decade as the amount of data being collected and stored continues to increase at a rapid rate. These researchers have been at the forefront of understanding the impact and implication of the quality of data on organizations. These issues will continue to grow in importance as nontraditional forms of data are collected."
Veda C. Storey, Tull Professor of Computer Information Systems, Georgia State University

About the Author

Yang W. Lee is Associate Professor at the Information, Operations, and Analysis Group in the College of Business Administration at Northeastern University.

Leo L. Pipino is Professor Emeritus of Management Information Systems at the University of Massachusetts, Lowell.

James D. Funk is Founder and Chief Information Architect at Beyond Accuracy, LLC.

Richard Y. Wang is Director of the MIT Information Quality Program (MITIQ), Codirector of the Total Data Quality Management Program at MIT (MIT TDQM), and University Professor at the University of Arkansas at Little Rock, where the first master's degree program in Information Quality has been established.

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