Covers in detail promising solutions at the device, circuit, and architecture levels of abstraction after first explaining the sensitivity of the various MOS leakage sources to these conditions from the first principles. Also treated are the resulting effects so the reader understands the effectiveness of leakage power reduction solutions under these different conditions. Case studies supply real-world examples that reap the benefits of leakage power reduction solutions as the book highlights different device design choices that exist to mitigate increases in the leakage components as technology scales.
Leakage in Nanometer CMOS Technologies
and over one million other books are available for Amazon Kindle.
Learn more
FREE Two-Day Shipping for Students. Learn more |
| ||||||||||||||||||||
Book Description
Special Offers and Product Promotions
- Buy $50 in qualifying physical textbooks, get $5 in Amazon MP3 Credit. Here's how (restrictions apply)
Product Details
Would you like to update product info or give feedback on images?
|
More About the Author
Discover books, learn about writers, read author blogs, and more.
Customer Reviews
|
Share your thoughts with other customers:
|
||||||||||||||||||||||
|
Most Helpful Customer Reviews
1 of 1 people found the following review helpful:
5.0 out of 5 stars
Excellent breadth and depth,
This review is from: Leakage in Nanometer CMOS Technologies (Integrated Circuits and Systems) (Hardcover)
I am usually a little concerned about edited books. Often they are not coherant. So, I was reluctant to buy this book. But given the topic and some well knownn authors I decided to give it a try. The material is not only cohesive, but also very educational, especially for someone who is new to this area. Right from the introductory material of the first chapter to the detailed methods covered makes this an excellent book for someone who wants to learn about leakage. I foun d the case studies very useful as well.
Share your thoughts with other customers: Create your own review
|
|
Inside This Book
(learn more)
First Sentence:
Benefits of CMOS technology scaling in the nanometer regime comes with the disruptive consequence of increasing MOS transistor leakages. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
power gating, drowsy mode, active leakage reduction, balloon circuit, reverse body bias, sleep transistor, standby voltage scaling, gating transistors, average current method, body bias values, highest frequency bin, intermediate node voltage, power consuming block, standby leakage power, active leakage power, leakage constraint, sleep devices, exclusive discharge patterns, local bias generators, offset source driving, word driver block, body biasing, adaptive body bias, reducing leakage power, standby leakage reduction Key Phrases - Capitalized Phrases (CAPs): (learn more)
Solid-State Circuits, Test Conf, Circuits Dig, Leakage Dependence, Renesas Microprocessors, International Symposium, Design Automation Conference, Frequency Ratio, Custom Integrated Circuits Conference, Kluwer Academic Publishers, Technologies Figure, Hitachi Ltd, Sequence Design New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Surprise Me!
Benefits of CMOS technology scaling in the nanometer regime comes with the disruptive consequence of increasing MOS transistor leakages. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
power gating, drowsy mode, active leakage reduction, balloon circuit, reverse body bias, sleep transistor, standby voltage scaling, gating transistors, average current method, body bias values, highest frequency bin, intermediate node voltage, power consuming block, standby leakage power, active leakage power, leakage constraint, sleep devices, exclusive discharge patterns, local bias generators, offset source driving, word driver block, body biasing, adaptive body bias, reducing leakage power, standby leakage reduction Key Phrases - Capitalized Phrases (CAPs): (learn more)
Solid-State Circuits, Test Conf, Circuits Dig, Leakage Dependence, Renesas Microprocessors, International Symposium, Design Automation Conference, Frequency Ratio, Custom Integrated Circuits Conference, Kluwer Academic Publishers, Technologies Figure, Hitachi Ltd, Sequence Design New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Surprise Me!
Citations (learn more)
This book cites 6
books:
See all 6 books this book cites
- A30.5 Integrated Circuits Video by Thomson Delmar Learning in Front Matter
- Design of High-Performance Microprocessor Circuits by Anantha Chandrakasan on page 139
- Digest of Technical Papers by IEEE International Pulsed Power Conference on page 255
- A Practical Guide for SystemVerilog Assertions (English and English Edition) by Srikanth Vijayaraghavan in Front Matter
- Dynamic Power Management: Design Techniques and CAD Tools by Luca Benini on page 104
See all 6 books this book cites
Books on Related Topics
(learn more)
|
Tag this product(What's this?)Think of a tag as a keyword or label you consider is strongly related to this product.
Tags will help all customers organize and find favorite items. |
Customer Discussions
|
This product's forum
Active discussions in related forums
Search Customer Discussions
|
Related forums
|
