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Liquid Surfaces and Interfaces: Synchrotron X-ray Methods Hardcover – September 17, 2012

ISBN-13: 978-0521814010 ISBN-10: 0521814014 Edition: 1st

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Editorial Reviews

Review

"This modest-sized volume is a real treasure trove for researchers of liquid surfaces and interfaces. Peter Pershan, a founding father and a prime motive in the field of synchrotron x-ray studies of liquid surfaces, and Mark Schlossman, a leading expert in the field, present an admirable combination of a comprehensive, in-depth, exposition of the experimental methods and their underlying theory and data analysis approaches, with a lucid discussion of selected results obtained using these methods. The book's first part is an invaluable guide for researchers wishing to enter the field. The second part is a broad, insightful and inspiring panorama of the field's major achievements, which is a joy to read, even separately from the first part. Although the selection is, by necessity, personal, it reflects elegantly the authors' wisdom, breadth of view, and 30 years of experience. I have no doubt that this volume will find a place of honor on the bookshelves of all researchers in the field worldwide." - Professor Moshe Deutsch, Physics Department & Institute of Nanoscience and Advanced Materials, Bar-Ilan University, Israel

"Anyone interested in learning about the physical properties of liquid surfaces will appreciate this comprehensive treatise that emphasizes synchrotron x-ray scattering methods. The book provides a rigorous approach to scattering theory as well as a practical guide on how to align instruments. Pershan and Schlossman present an excellent summary of our current understanding of the structure and thermal fluctuations observed at liquid interfaces with a wide range of examples extending from simple liquids to Langmuir Monolayers. There is no doubt that this will become the standard for many years." - Ben Ocko, Brookhaven National Laboratory

"The liquid state is stable in only a small domain of the space of density, pressure and temperature, yet it plays a dominant role in living and geological processes on earth, and in many manufacturing processes. And every liquid is contained by bounding materials that generate interfaces with properties that are different from those in the contacting phases. It has been realized for two centuries that those interfaces play several important roles in determining phenomena in our world. However, it is only in the last three decades that experimental methodology has advanced to the point that the relationships between the atomic/molecular structure of interfaces and interfacial properties can be studied and interpreted. Profs. Peter Pershan and Mark Schlossman, who are pioneers in the development of the modern experimental tools for the study of liquid interfaces, have written a masterful account of the uses of x-ray reflection and scattering to study liquid interfaces, and of the interpretation of the findings for many such interfaces. Their incisive treatment of the experimental methodology and the analysis of data obtained make this book a "must read" for all physicists and chemists interested in liquid interfacial phenomena. This book will serve several purposes: as an introduction to the field for graduate students, as a reference to the subtleties of interpretation of data for active users of synchrotron radiation for interface studies, and as a thought provoking survey of the many subtle properties of liquid interfaces and the differences and similarities of those properties across classes of liquids and contact media." - Stuart A. Rice, University of Chicago

Book Description

A practical guide to all aspects of x-ray scattering experiments on liquid surfaces and interfaces, this book enables readers to understand and carry out experimental investigations into molecular ordering at liquid surfaces and interfaces. It is ideal for graduate students and researchers in physics, chemistry, biology and materials science.
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Liquid Surfaces and Interfaces: Synchrotron X-ray Methods
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