Amazon.com: MOSFET Modeling and BSIM3 User's Guide (9780792385752): Yuhua Cheng, Chenming Hu: Books
MOSFET Modeling and BSIM3 User's Guide and over one million other books are available for Amazon Kindle. Learn more


or
Sign in to turn on 1-Click ordering.
or
Amazon Prime Free Trial required. Sign up when you check out. Learn More
More Buying Choices
Have one to sell? Sell yours here
MOSFET Modeling and BSIM3 User's Guide
 
 
Start reading MOSFET Modeling and BSIM3 User's Guide on your Kindle in under a minute.

Don't have a Kindle? Get your Kindle here, or download a FREE Kindle Reading App.

MOSFET Modeling and BSIM3 User's Guide [Hardcover]

Yuhua Cheng (Author), Chenming Hu (Author)

Price: $299.00 & this item ships for FREE with Super Saver Shipping. Details
o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o
In Stock.
Ships from and sold by Amazon.com. Gift-wrap available.
Only 1 left in stock--order soon (more on the way).
Want it delivered Tuesday, February 28? Choose One-Day Shipping at checkout. Details
Textbook Student FREE Two-Day Shipping for students on millions of items. Learn more

Formats

Amazon Price New from Used from
Kindle Edition $220.00  
Hardcover $299.00  

Book Description

September 30, 1999 0792385756 978-0792385752 1st
Circuit simulation is essential in integrated circuit design, and the accuracy of circuit simulation depends on the accuracy of the transistor model. BSIM3v3 (BSIM for Berkeley Short-channel IGFET Model) has been selected as the first MOSFET model for standardization by the Compact Model Council, a consortium of leading companies in semiconductor and design tools.
In the next few years, many fabless and integrated semiconductor companies are expected to switch from dozens of other MOSFET models to BSIM3. This will require many device engineers and most circuit designers to learn the basics of BSIM3.
MOSFET Modeling & BSIM3 User's Guide explains the detailed physical effects that are important in modeling MOSFETs, and presents the derivations of compact model expressions so that users can understand the physical meaning of the model equations and parameters.
It is the first book devoted to BSIM3. It treats the BSIM3 model in detail as used in digital, analog and RF circuit design. It covers the complete set of models, i.e., I-V model, capacitance model, noise model, parasitics model, substrate current model, temperature effect model and non quasi-static model.
MOSFET Modeling & BSIM3 User's Guide not only addresses the device modeling issues but also provides a user's guide to the device or circuit design engineers who use the BSIM3 model in digital/analog circuit design, RF modeling, statistical modeling, and technology prediction.
This book is written for circuit designers and device engineers, as well as device scientists worldwide. It is also suitable as a reference for graduate courses and courses in circuit design or device modelling. Furthermore, it can be used as a textbook for industry courses devoted to BSIM3.
MOSFET Modeling & BSIM3 User's Guide is comprehensive and practical. It is balanced between the background information and advanced discussion of BSIM3. It is helpful to experts and students alike.

Product Details


More About the Authors

Discover books, learn about writers, read author blogs, and more.

Customer Reviews


There are no customer reviews yet.
Video reviews
Video reviews
Amazon now allows customers to upload product video reviews. Use a webcam or video camera to record and upload reviews to Amazon.



Inside This Book (learn more)
First Sentence:
During the 1970's, MOS technology emerged as the major driving force for VLSI [1.1]. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
different body biases, channel charge model, thermal noise model, bulk charge effect, gate depletion effect, substrate current model, threshold voltage model, current induced body effect, periphery capacitance, inner fringing capacitance, small size mosfets, narrow width effect, field oxide edge, binning approach, body bias effect, charge partition, strong inversion region, channel width decreases, model parameter extraction, sidewall junction, compact modeling, reverse short channel effect, velocity saturation region, model selector, digital circuit simulation
Key Phrases - Capitalized Phrases (CAPs): (learn more)
University of California, Fitting Target Data, After Cheng, Solid-State Electronics, New York, Compact Model Workshop, After Chan, Computer-aided Design, After Huang, Description Default Unit, John Wiley, Abulk Vds, Ahulk Vds, After Jin, After Liu, Compact Model Council, Abulk Vcveff, International Conference, Model Testing, Technical Digest, Academic Press, Solid State Electronics, Cadence Design Systems, Channel Charge Theory, Englewood Cliffs
New!
Books on Related Topics | Concordance | Text Stats
Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Search Inside This Book:




Tag this product

 (What's this?)
Think of a tag as a keyword or label you consider is strongly related to this product.
Tags will help all customers organize and find favorite items.
Your tags: Add your first tag
 

Customer Discussions

This product's forum
Discussion Replies Latest Post
No discussions yet

Ask questions, Share opinions, Gain insight
Start a new discussion
Topic:
First post:
Prompts for sign-in
 


Active discussions in related forums
Search Customer Discussions
Search all Amazon discussions
   
Related forums


Listmania!


Create a Listmania! list

So You'd Like to...


Create a guide


Look for Similar Items by Category


Look for Similar Items by Subject