Key Phrases - Statistically Improbable Phrases (SIPs):
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single joint contact resistance, pulse recipe, anode extrusion, charge trapping devices, porogen load, nickel nanowires, copper interconnect structures, filtration side, initial contact resistance, contact resistance stability, wide metal line, damascene structure, precursor injection, liquid adsorptive, magnetic nanowires, memory transistor, tunnel oxide, barrier deposition, dumbbell structure, electrically conductive adhesives, metal line width, atomic layer deposition, copper interconnects, argon ion milling, stop interface
Key Phrases - Capitalized Phrases (CAPs):
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Thin Solid Films, New York, Advanced Metallization Conference, International Interconnect Technology Conference, Solid State Lett, Device Lett, Infineon Technologies, International Conference, Gueneau de Mussy, Physics Research, San Diego, Sol-Gel Sci, Technology Digest of Technical Papers, Academic Press, Appl Phys, Journal of Applied Physics, Monte Carlo, Rose Bengal, Solid State Electron, Applied Physics Letters, Electron Devices, Philosophical Magazine, Van Hove, Acknowledgements Thanks, Fowler Nordheim
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