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Materials Science of Thin Films, Second Edition
 
 
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Materials Science of Thin Films, Second Edition [Hardcover]

Milton Ohring (Author)
4.0 out of 5 stars  See all reviews (2 customer reviews)

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There is a newer edition of this item:
Materials Science of Thin Films, Third Edition: Deposition and Structure Materials Science of Thin Films, Third Edition: Deposition and Structure
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Book Description

0125249756 978-0125249751 October 29, 2001 2
This is the first book that can be considered a textbook on thin film science, complete with exercises at the end of each chapter. Ohring has contributed many highly regarded reference books to the AP list, including Reliability and Failure of Electronic Materials and the Engineering Science of Thin Films. The knowledge base is intended for science and engineering students in advanced undergraduate or first-year graduate level courses on thin films and scientists and engineers who are entering or require an overview of the field.

Since 1992, when the book was first published, the field of thin films has expanded tremendously, especially with regard to technological applications. The second edition will bring the book up-to-date with regard to these advances. Most chapters have been greatly updated, and several new chapters have been added.

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Editorial Reviews

Review

Praise for the First Edition
"There is a need for new, comprehensive texts and references in [advanced materials processing] and its subdisciplines. This has been especially true for thin films, and of the several recent books on the subject, Milton Ohring's extensive volume is without a doubt the best."
--NATURE
"Ohring's very timely and excellent book fills a long-existing need in materials education at the graduate level....The book is very well written, presented, and illustrated. It will prove useful to the scientist or engineer in coatings, to the college senior working on a project, and especially to graduate students in materials science and engineering and to faculty involved in teaching or research in the area of thin films. An excellent acquisition for an academic library."
--CHOICE
"The author writes in a fluent and engaging style which the student should have little trouble in understanding. His examples and technical insights do a great deal to make his text readable..."
--R.J. BORG
"The combination of teaching, research, and industrial involvement has provide Profesor Ohring with a broad perspective of thin film science and technoloy and tremendous insight into the needs of students entering this exciting field. His insight and experience are quite evident in this textbook."
--JOHN L. VOSSEN, John Vossen Associates, Inc.
"The text is easy to read, technically correct, unfolds in a logical manner, and includes a large number of important features related to thin films. I congratulate the author for proposing a thoughtful treatment of this increasingly popular subject."
--CHARLES L. BAUER, Carnegie Mellon University
"Professor Milt Ohring has a long and unique perspective of thin film science from his dealings with academia and industry. This book represents his accumulated experiences of teaching and research. Thin film science is at the heart of many of our most advanced technologies. This book should prove invaluable not only to the university student but also to the professional who needs a broad overview of this important field."
--J.M. POATE, AT&T Bell Laboratories

About the Author

Dr. Milton Ohring, author of two previously acclaimed Academic Press books,The Materials Science of Thin Films (l992) and Engineering Materials Science (1995), has taught courses on reliability and failure in electronics at Bell Laboratories (AT&T and Lucent Technologies). From this perspective and the well-written tutorial style of the book, the reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices; acquire skills in the mathematical handling of reliability data; and better appreciate future technology trends and the reliability issues they raise.


Product Details

  • Hardcover: 794 pages
  • Publisher: Academic Press; 2 edition (October 29, 2001)
  • Language: English
  • ISBN-10: 0125249756
  • ISBN-13: 978-0125249751
  • Product Dimensions: 9.3 x 6.4 x 1.6 inches
  • Shipping Weight: 2.7 pounds (View shipping rates and policies)
  • Average Customer Review: 4.0 out of 5 stars  See all reviews (2 customer reviews)
  • Amazon Best Sellers Rank: #105,114 in Books (See Top 100 in Books)

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9 of 9 people found the following review helpful:
5.0 out of 5 stars good, July 16, 2004
This review is from: Materials Science of Thin Films, Second Edition (Hardcover)
This is a very good book for coating engineers. The richness of the explanation of a variety of subjects is worthy of reading it carefully, from beginning to the end.

And in addition, I find the process of reading the book is quite a happy thing of enjoying the beauty of English, though I am not a native speaker.(I'd like to look forward to reading similar comments so as to confirming this impression of mine)

The book is precise and in depth.

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1 of 15 people found the following review helpful:
3.0 out of 5 stars the long road to quality, January 8, 2007
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This review is from: Materials Science of Thin Films, Second Edition (Hardcover)
sorry for the fella who authored the book, he still has a long way to reach the level at which the interested customer finds the book of reference for the field of study;
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Inside This Book (learn more)
First Sentence:
A cursory examination of the vast body of solid substances reveals what outwardly appears to be an endless multitude of external forms and structures possessing a bewildering variety of properties. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
epitaxial semiconductor films, evaporant atoms, bulge testing, impingement flux, electromigration damage, capillarity theory, evaporant source, deposition geometry, salicide process, thin film science, film nucleation, heteroepitaxial structures, depositing atoms, web coating, film texture, conformal coverage, film purity, reactive gas flow, film growth rates, epitaxial film growth, target erosion, deposition variables, film stoichiometry, selective epitaxy, epitaxial films
Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Academic Press, John Wiley, Thin Solid Films, Bell Laboratories, Park Ridge, San Diego, The Netherlands, After Ref, Solid State Mater, Watson Research Center, Noyes Publications, Tangent Rule, Thin Film Processes, Physics of Thin Films, Handbook of Ion Beam Processing Technology, Kluwer Academic, Monte Carlo, Solid State Technol, Thin-Film Evaporation Processes, Handbook of Thin Film Technology, Oxford University Press, Physics Today, Elsevier Sequoia, Melts Graphite
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