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The Metrics of Science and Technology
 
 
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The Metrics of Science and Technology [Hardcover]

Eliezer Geisler (Author)
5.0 out of 5 stars  See all reviews (1 customer review)

Price: $125.00 & this item ships for FREE with Super Saver Shipping. Details
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Book Description

August 30, 2000

Dr. Geisler's far-reaching, unique book provides an encyclopedic compilation of the key metrics to measure and evaluate the impact of science and technology on academia, industry, and government. Focusing on such items as economic measures, patents, peer review, and other criteria, and supported by an extensive review of the literature, Dr. Geisler gives a thorough analysis of the strengths and weaknesses inherent in metric design, and in the use of the specific metrics he cites. His book has already received prepublication attention, and will prove especially valuable for academics in technology management, engineering, and science policy; industrial R&D executives and policymakers; government science and technology policymakers; and scientists and managers in government research and technology institutions.

Geisler maintains that the application of metrics to evaluate science and technology at all levels illustrates the variety of tools we currently possess. Each metric has its own unique strengths and weaknesses, but overall, metrics offer the best possible way to evaluate science and technology. He then finds that in general, science and technology have a positive effect on the human experience. Truly state of the art in the study of the metrics of science and technology, their outcomes and contributions to society and the economy, the book provides unique analyses of the academic world and its most useful metrics: the industrial science/technology research and development complex, and the government network of laboratories. For each, Geisler gives a comprehensive analysis of the main metrics and their best applications. His book is thus also usable in certain advanced undergraduate and graduate courses and seminars that treat technology and engineering management, project management in technology industries, and the evaluation of social and economic programs.


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Editorial Reviews

Review

"What a monumental effort! This book should be on the shelf of every person involved in the performance, management, administration, acquisition, evaluation, and oversight of S&T. After an excellent discussion of inputs, outputs, and outcomes from S&T, the book presents an exhaustive evaluation of the strenghts and weaknesses of each metic. The book is very eclectic, it draws from a variety of global references and experiences. While much of the analysis relates to United States experiences, both European and Asian experiences are highlighted as well. The book is not only of the highest levels of academic scholarship, but is eminently practical for use as an operational handbook."-Dr. Ronald N. Kostoff Office of Naval Research

Book Description

Compilation of the key metrics to measure and evaluate the impact of science and technology on academia, industry, and government.


Product Details

  • Hardcover: 400 pages
  • Publisher: Quorum Books (August 30, 2000)
  • Language: English
  • ISBN-10: 1567202136
  • ISBN-13: 978-1567202137
  • Product Dimensions: 9.5 x 6.3 x 0.9 inches
  • Shipping Weight: 1.6 pounds (View shipping rates and policies)
  • Average Customer Review: 5.0 out of 5 stars  See all reviews (1 customer review)
  • Amazon Best Sellers Rank: #1,708,789 in Books (See Top 100 in Books)

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0 of 3 people found the following review helpful:
5.0 out of 5 stars Professor Wagdy Abdallah, August 4, 2004
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This review is from: The Metrics of Science and Technology (Hardcover)
To the managment of Amazon.com
You put my name by mistake this is not my book. I tried to contact you several times. Please correct the information on your website
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Inside This Book (learn more)
First Sentence:
"In the study of research and development and the evaluation of science and technology in the United States, it is customary to refer to advances in these areas that occurred after the Second World War." Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
bibliographic outcomes, database tomography, bibliometric measures, innovation continuum, bibliometric indicators, using bibliometrics, science indicators, technology corridors, metric selection, citation analysis, immediate outputs, judgmental assessment, ultimate outputs, diffusion activities, patent data, patent counts, scientific outcomes, national innovation system, technology roadmaps, scientific performance, intermediate outputs, core indicators
Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Research Policy, United States, Engineering Management, Second World War, National Science Foundation, International Journal, John Wiley, Oxford University Press, Research-Technology Management, Research Management, Management Science, American Economic Review, National Science Board, University of Chicago Press, Case Study, Harvard Business Review, Strategic Management Journal, San Francisco, Technology Analysis, The Metncs, United Kingdom, Cambridge University Press, Engineering Indicators, Industrial Revolution
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