Atom Probe Field Ion Microscopy (Monographs on the Physics and Chemistry of Materials) [Hardcover]

M. K. Miller (Author), A. Cerezo (Author), the late M. G. Hetherington (Author), G. D. W. Smith (Author)

Book Description

ISBN-10: 0198513879 | ISBN-13: 978-0198513872 | Publication Date: November 28, 1996

The atom probe technique permits the imaging and chemical identification of individual and solid surfaces. It is one of the most important experimental methods in the emerging field of atomic-scale science and technology. This book gives a definitive and up-to-date account of the field, and is written by leading authorities on the subject. It includes recent advances in the method which have allowed for new and exciting applications to emerge in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.

Editorial Reviews

Review

`The book is an excellent resource for anyone entering the field ... strongly recommended at all levels among those who feel curious about this non-obvious way of doing high resolution ion microscopy and analysis at the atomic level.' T. Mulvey, Measurement Science Technology 8 (1997)

`For the practising analyst there are nine useful appendices including one on specimen preparation, and the book will be invaluable to researchers in the above fields.' Aslib Book Guide, vol.61, no.12, December 1996.

About the Author

Hetherington - deceased

Product Details

• Hardcover: 532 pages
• Publisher: Oxford University Press, USA (November 28, 1996)
• Language: English
• ISBN-10: 0198513879
• ISBN-13: 978-0198513872
• Product Dimensions: 9.4 x 6.3 x 1.4 inches
• Shipping Weight: 2.2 pounds
• Average Customer Review: 5.0 out of 5 stars  See all reviews (1 customer review)
• Amazon Best Sellers Rank: #3,843,976 in Books (See Top 100 in Books)

Customer Reviews

Most Helpful Customer Reviews

0 of 1 people found the following review helpful:

5.0 out of 5 stars Excellent reference for field ion microscopy, February 12, 2005

By 

Keith Thompson - See all my reviews
(REAL NAME)   

This review is from: Atom Probe Field Ion Microscopy (Monographs on the Physics and Chemistry of Materials) (Hardcover)

This book provides an in-depth and highly understandable analysis of field ion microscopy.