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0 of 1 people found the following review helpful:
2.0 out of 5 stars
Not very rigorous,
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This review is from: Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology) (Hardcover)
This book is not very rigorous. It does not cover the details on the techniques. Very few diagrams. A lot of data with little scaling, theoretical treatment or simple mathematics to describe results. What am I supposed to do?... Memorize the results for each experiment?... It is representative with the poor state of research science. Lots of money, lots of people spending it buying equipment, and everybody doing what everybody else is doing, except using a different material. Poor... poor... poor...
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience... by G. Kaupp (Hardcover - September 15, 2006)
$169.00
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