As suggested by the title, the book is divided into two major parts, microwave circuit theory, which includes chapters 1-9, and microwave metrology which comprises the remainder. The introductory chapters (primarily Chapter 2) are intended to provide a simplified outline of the theoretical basis for microwave (as contrasted with low frequency) circuit theory. These are based to a large degree upon the prior work of D.M. Kerns, whose example of careful formulation has been a source of unending challenge and inspiration to the author. Following this, the focus shifts to a development of the scattering notation, and where special attention is given to those features which make microwave metrology different from its lower frequency counterpart. The second part of the book describes the different experimental strategies which have been devised to measure the parameters associated with the microwave model. From one perspective, some of these are now 'obsolete' by virtue of the introduction of the automated network analyzer. On the other hand, for the serious student of metrology, the strategies are of continued interest even if the methods by which they were implemented are not. In the author's experience, an intuitive mental picture of the system operation can be an invaluable asset, although never a substitute for a careful analytical formulation. An example is the tuned reflectometer. Although for most applications the method is obsolete, an understanding of the associated theory can still provide useful insights into the microwave circuit model, and the operation of other measurement techniques.
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