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Ion beam technology is of vital importance in the area of microfabrication.
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Key Phrases - Statistically Improbable Phrases (SIPs):
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percent monomer conversion, acoustic agitation, photophysical ablation, etch depth per pulse, heat diffusion model, ablated depth, ablation velocity, laser chemical vapor deposition, mask membrane, photophysical model, absorber edge, dissolution distance, slowness curve, high aspect ratio microstructures, soft focusing, proximity gap, monomer layer, polymer ablation, bottom dose, ablation depth, solidified polymer, ion beam technology, maximum temperature rise, thick gold film, sputter yield
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Elsevier Science, American Institute of Physics, American Vacuum Society, Francis Inc, Publishing Limited, American Chemical Society, Allerton Press Inc, Francis Ltd, New York, American Physical Society, Monte Carlo, Conversion Fig, Marcel Dekker Inc, Navier Stokes, University Press
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