The book describes the physical basis of all of the principal and the majority of the more specialized techniques used today in studies of well-characterized solid surfaces. The techniques are grouped according to the underlying physics and are described in nine chapters. The treatment of each technique concentrates on the basic physical principles, and illustrates its use with selected examples with an emphasis on understanding the concepts. Included in each of these discussions is a view of the strengths, the weaknesses, and the complementary aspects of the individual methods. Although some mention is included of the potential use of some of the methods to study technical surfaces, the emphasis of the examples is taken from studies of the basic chemistry and physics of well-characterized surfaces under ultra-high vacuum conditions, aimed at elucidating their structural, compositional, electronic, and vibrational properties. This edition includes new material on synchrotron radiation related techniques, scanning tunnelling microscopy and spectroscopy, and Raman spectroscopy.
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'Besides the dramatic development in surface science in the last few years it is, in particular, the clarity and homogeneity of the book that have led to its remarkable success ... an excellent textbook.' Zeitschrift fur Physikalische Chemie
'Their style makes this a very readable book ... the organisation and an extensive index make it easy to locate the appropriate section for the technique of interest.' Physics Today
'Their style makes this a very readable book ... the organisation and an extensive index make it easy to locate the appropriate section for the technique of interest.' Physics Today
Book Description
This book describes the physical basis of all of the principal and the majority of the more specialized techniques used today in studies of well-characterized solid surfaces. The techniques are grouped according to the underlying physics and are described in nine chapters.
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The classification and description of symmetry properties and structures of bulk (three-dimensional) crystalline materials require a reasonable understanding of crystallography; notably of the restricted number of types of translational symmetry which crystals can possess (characterised by their associated unit cell which must be one of the 14 Bravais lattices) and the finite number of point and space groups which can define the additional symmetry properties of all possible crystals. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
reciprocal net rods, top atom layer, probe field ion microscope, photoionisation threshold, final state bands, scatterer planes, surface specificity, surface composition analysis, ionisation zone, mean work function, adiabatic peak, desorbing ions, neutralisation process, wavefunction magnitude, neutralisation effects, surface unit mesh, fixed photon energy, geometrical structure factor, channelling directions, field ionisation, ionisation probability, surface structure determination, substrate mesh, incident ion energy, few atom layers Key Phrases - Capitalized Phrases (CAPs): (learn more)
Experimental X-ray, Inverse Photoemission Spectroscopy, Pump Fig New!
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The classification and description of symmetry properties and structures of bulk (three-dimensional) crystalline materials require a reasonable understanding of crystallography; notably of the restricted number of types of translational symmetry which crystals can possess (characterised by their associated unit cell which must be one of the 14 Bravais lattices) and the finite number of point and space groups which can define the additional symmetry properties of all possible crystals. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
reciprocal net rods, top atom layer, probe field ion microscope, photoionisation threshold, final state bands, scatterer planes, surface specificity, surface composition analysis, ionisation zone, mean work function, adiabatic peak, desorbing ions, neutralisation process, wavefunction magnitude, neutralisation effects, surface unit mesh, fixed photon energy, geometrical structure factor, channelling directions, field ionisation, ionisation probability, surface structure determination, substrate mesh, incident ion energy, few atom layers Key Phrases - Capitalized Phrases (CAPs): (learn more)
Experimental X-ray, Inverse Photoemission Spectroscopy, Pump Fig New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
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This book cites 17
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64
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- Practical Surface Analysis, Auger and X-ray Photoelectron Spectroscopy (Volume 1) by D. Briggs in Back Matter (1), and Back Matter (2)
- Chemistry & Physics of Solid Surfaces, Vol. 4 by R. Vanselow on page 531, and Back Matter
- Photoemission and the Electronic Properties of Surfaces by B. Feuerbacher in Back Matter (1), and Back Matter (2)
- Microscopic Methods in Metals (Topics in Current Physics) by U. Gonser in Back Matter
- Synchrotron Radiation Research by Herman Winick in Back Matter
See all 17 books this book cites
- Oxide Surfaces (The Chemical Physics of Solid Surfaces) by D. P. Woodruff on page 33, and page 405
- Advances in Chemical Physics, Surface Properties (Volume 95) by I. Prigogine on page 208, and page 394
- Introduction to Surface and Thin Film Processes by John A. Venables on page 105, and Back Matter
- Modern Electrochemistry 2A: Fundamentals of Electrodics by John O'M. Bockris on page 794, and page 797
- Surface and Nanomolecular Catalysis by Ryan Richards on page 26, and page 369
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