This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.
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"The aim of this book is to present recent advances in nanoscale characterization of electrical, mechanical and optical properties of ferroelectric materials made possible due to the use of the SPM techniques. … will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. … The book succeeds in being informative, balanced and intelligent … . The references at the end of each chapter also make the book consistently informative and steadily rewarding." (Current Engineering Practice, Vol. 47 (3), 2004-2005)
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This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.
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Recent progress in oxide electronic devices including microelectromechanical systems (MEMS), non-volatile ferroelectric memories (FeRAMs), and ferroelectric heterostructures necessitates an understanding of local ferroelectric properties on the nanometer level. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
indentation limit, dielectric microscopy, nanodomain engineering, strong indentation regime, voltage atomic force microscope, nonlinear dielectric imaging, piezoresponse mode, ferroelectric surfaces, piezoresponse signal, buckling oscillations, measured piezoresponse, paraelectric layer, piezoresponse force microscopy, piezoresponse images, longitudinal piezoelectric coefficient, probing voltage, remanent hysteresis, domain breakdown, electroelastic constants, piezoresponse measurements, coercive voltage, ferroelectric sample, effective piezoelectric coefficient, clamped capacitor, nonlinear dielectric response Key Phrases - Capitalized Phrases (CAPs): (learn more)
Appl Phys Lett, Phys Rev, New York, Opt Lett, Vac Sci Technol, Phil Mag, Electron Lett, Phys Soc Japan, Sov Phys Solid State, Surf Sci, Electrical Characterization of Nanoscale Ferroelectric Structures, Introduction Ferroelectric, Mat Res, Pergamon Press, Physical Review, Rev Sci Instrum, Solid State Commun New!
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- Ferroelectric Crystals by Franco Jona on page 219, and page 263
- Noncontact Atomic Force Microscopy by S. Morita in Front Matter
- Theory of Elasticity (McGraw-Hill Classic Textbook Reissue Series) by S. Timoshenko on page 42
- Physical Properties of Crystals: Their Representation by Tensors and Matrices by J. F. Nye on page 84
- Handbook of Advanced Electronic and Photonic Materials and Devices, Ten-Volume Set by Hari Singh Nalwa on page 264
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