Nonvolatile Semiconductor Memory Technology: A Comprehensive Guide to Understanding and Using NVSM Devices (IEEE Press Series on Microelectronic Systems) [Hardcover]

William D. Brown (Editor), Joe Brewer (Editor)

Book Description

ISBN-10: 0780311736 | ISBN-13: 978-0780311732 | Publication Date: October 15, 1997 | Edition: 1

"Complete dependence on semiconductor vendors' application notes and data sheets is now a thing of the past thanks to this all-in-one comparison text on nonvolatile semiconductor memory (NVSM) technology. Working electronics engineers can now refer to this book to access the technical data and applications-focused perspective they need to make intelligent decisions regarding the selection, specification, procurement, and application of NVSM devices.

The most comprehensive book in the field, NONVOLATILE SEMICONDUCTOR MEMORY TECHNOLOGY gathers expertly-written information scattered throughout device literature in a single, well-balanced volume. This book features an in-depth overview accompanied by applications-oriented chapters on device reliability and endurance, radiation tolerance, as well as device physics and design. It is an essential reference for electronics engineers."

Sponsored by:
IEEE Components, Packaging, and Manufacturing Technology Society, IEEE Solid-State Circuits Council/Society.

Editorial Reviews

From the Back Cover

Electrical Engineering Nonvolatile Semiconductor Memory Technology A Comprehensive Guide to Understanding and Using NVSM Devices Complete dependence on semiconductor vendors’ application notes and data sheets is now a thing of the past thanks to this all-in-one comparison text on nonvolatile semiconductor memory (NVSM) technology. Working electronics engineers can now refer to this book to access the technical data and applications-focused perspective they need to make intelligent decisions regarding the selection, specification, procurement, and application of NVSM devices. The most comprehensive book in the field, Nonvolatile Semiconductor Memory Technology gathers expertly written information scattered throughout device literature in a single, well-balanced volume. This book features an in-depth overview accompanied by applications-oriented chapters on device reliability and endurance, radiation tolerance, as well as device physics and design. It is an essential reference for electronics engineers.

About the Author

About the Editors William D. Brown is a university professor and head of the Department of Electrical Engineering at the University of Arkansas. As a Member of the Technical Staff at Sandia Laboratories in Albuquerque, NM, from 1969-1977, Dr. Brown initiated Sandia s research and development effort on metal-nitride-oxide-silicon (MNOS) device technology. After joining the faculty at the University of Arkansas in 1977, his nonvolatile semiconductor memory research concentrated on the synthesis and characterization of plasma-enhanced chemical vapor deposited (PECVD) silicon nitride for application in MNOS and SNOS memory devices. Dr. Brown has served on IEEE NVM standards committees, and he is an organizer and participant in the IEEE International Nonvolatile Memory Technology Conference and its precursor conferences.

Joe E. Brewer is a Senior Advisory Engineer at the Northrop Grumman Corporation Electronic Sensors and Systems Division located near Baltimore, MD. Throughout his 36-year engineering career, Dr. Brewer has been engaged in the development of state-of-the-art microelectronic technology. He has been both a developer and user of NVSM devices. He has had extensive experiences with MNOS block-oriented devices and storage systems, as well as a variety of SONOS devices. Dr. Brewer has also served on IEEE NVM standards committees, and he is an organizer and participant in the IEEE International Nonvolatile Memory Technology Conference and its precursor conferences.

Product Details

• Hardcover: 590 pages
• Publisher: Wiley-IEEE Press; 1 edition (October 15, 1997)
• Language: English
• ISBN-10: 0780311736
• ISBN-13: 978-0780311732
• Product Dimensions: 7.1 x 1.3 x 10.2 inches
• Shipping Weight: 2.5 pounds (View shipping rates and policies)
• Average Customer Review: 5.0 out of 5 stars  See all reviews (1 customer review)
• Amazon Best Sellers Rank: #546,135 in Books (See Top 100 in Books)

Customer Reviews

Most Helpful Customer Reviews

11 of 11 people found the following review helpful:

5.0 out of 5 stars NV Memory Technology book review, April 30, 2000

By A Customer

This review is from: Nonvolatile Semiconductor Memory Technology: A Comprehensive Guide to Understanding and Using NVSM Devices (IEEE Press Series on Microelectronic Systems) (Hardcover)

This book is one of the most comprehensive sources available for information on non-volatile memory ICs. The subject material gives in-depth coverage of EPROM, EEPROM and FLASH design, fabrication and reliability issues. The information is extremely well-organized, thorough and practical and was obviously written by practicing professionals as opposed to academia. The illustrations are numerous and excellent. Numerous references are cited as sources for additional information. This is NOT one of those technical books which is merely a collection of published aricles. The authors obviously established a structure of relevant topics prior to developing their subjects and choosing their reference sources. The weakest areas of the book were test and ultra low power NV design.