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Optical Metrology
 
 
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Optical Metrology [Hardcover]

Kjell J. Gåsvik (Author)
5.0 out of 5 stars  See all reviews (1 customer review)

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Book Description

0470843004 978-0470843000 July 15, 2002 3
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping.
* New introductory sections to all chapters.
* Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
* Thorough coverage of the CCD camera.

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Editorial Reviews

From the Back Cover

Recent advances in optical devices and computer technology have enabled the development of new optical systems and techniques for measurement. Providing practical guidance for readers with a minimal background in optics, the third edition of this classic book explores the latest optical metrology technologies, from digital holography and digital speckle photography to fibre Bragg sensors and optical coherence tomography.

Features include:
* A chapter on computerised optical processes such as electronic speckle interferometry, digital holography and digital speckle photography.

* Sections introducing optical sources and detectors, including diode lasers, light emitting diodes and photoelectric detectors and the CCD camera.

* Coverage of digital fringe pattern measurement techniques with special emphasis on phase measurement interferometry and phase unwrapping.

* Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.

* A revised chapter on digital image processing, including noise suppression, edge- and fringe detection with sub-pixel accuracy, the DFT and the FFT.

* End-of-chapter problems and solutions.
This holistic treatment provides students and professionals in the field of optical and communications engineering with an accessible and self-contained guide to all of the main optical metrology techniques in use today.

Product Details

  • Hardcover: 372 pages
  • Publisher: Wiley; 3 edition (July 15, 2002)
  • Language: English
  • ISBN-10: 0470843004
  • ISBN-13: 978-0470843000
  • Product Dimensions: 6.9 x 1.2 x 9.8 inches
  • Shipping Weight: 1.9 pounds (View shipping rates and policies)
  • Average Customer Review: 5.0 out of 5 stars  See all reviews (1 customer review)
  • Amazon Best Sellers Rank: #2,484,920 in Books (See Top 100 in Books)

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5.0 out of 5 stars Please., February 10, 1999
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Inside This Book (learn more)
First Sentence:
Before entering into the different techniques of optical metrology some basic terms and definitions have to be established. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
digital speckle photography, digital fringe pattern measurement techniques, plane polariscope, reconstructed object wave, coherent transfer function, quarterwave plate, fringe localization, circular polariscope, speckle displacement, shadow moiré, autocorrelation theorem, filter plane, afocal system, reconstructed wave, optical metrology, amplitude hologram, digital holography, principal stress difference, temporal degree, fringe period, hologram plate, reconstruction wave, cavity dumping, fringe maximum, speckle size
Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Prentice Hall, John Wiley, Academic Press, Englewood Cliffs
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