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Optical Scattering: Measurement and Analysis (SPIE Press Monograph Vol. PM24) (Press Monographs) [Hardcover]

John C. Stover (Author)


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Hardcover --  
Hardcover, July 1, 1995 --  
Paperback $70.00  

Book Description

July 1, 1995 0819419346 978-0819419347 Second
As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable.

Contents:
- Introduction to Light Scatter
- Surface Roughness
- Scatter Calculations and Diffraction Theory
- Calculation of Smooth-Surface Statistics from the BRDF
- Polarization of Scattered Light
- Scatter Measurements and Instrumentation
- Scatter Predictions
- Detection of Discrete Surface and Subsurface Defects
- Industrial Applications
- Scatter Specifications
- Review of Electromagnetic Wave Propogation
- Kirchhoff Diffraction from Sinusoidal Gratings


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Product Details

  • Hardcover: 340 pages
  • Publisher: SPIE Publications; Second edition (July 1, 1995)
  • Language: English
  • ISBN-10: 0819419346
  • ISBN-13: 978-0819419347
  • Product Dimensions: 10.3 x 7.3 x 0.9 inches
  • Shipping Weight: 1.8 pounds
  • Amazon Best Sellers Rank: #2,746,514 in Books (See Top 100 in Books)

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Inside This Book (learn more)
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
scatter specifications, average surface wavelength, surface power spectral density function, molybdenum mirror, surface power spectrum, vector perturbation theory, bulk scatter, scatter predictions, instrument signature, electronic noise floor, roughness statistics, specular beam, receiver aperture, mirror scatter, grating amplitude, reflective sample, scatter problems, wavelength scaling, scatter pattern, integrated scatter, transmissive optics, sample scatter, scatter levels, laser port, autocorrelation length
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Snell's Law, Examination of Fig, The Stokes, Surface Statistics, Optical Scattering
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