Amazon.com: Oscillation-Based Test in Mixed-Signal Circuits (Frontiers in Electronic Testing) (9781402053146): Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, Jose Luis Huertas Díaz: Books

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Oscillation-Based Test in Mixed-Signal Circuits (Frontiers in Electronic Testing) [Hardcover]

Gloria Huertas Sánchez (Author), Diego Vázquez García de la Vega (Author), Adoración Rueda Rueda (Author), Jose Luis Huertas Díaz (Author)

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Book Description

November 6, 2006 1402053142 978-1402053146 1
This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.

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About the Author

Prof. José Luis Huertas is Director of the Instituto de Microelectronica de Sevilla in Spain. He has edited one book on Testing for Kluwer, that published in October 2004, and was series editor for the three book series from the European Mixed-Signal Initiative for Electronic System Design.

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Inside This Book (learn more)
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
input buffer, amplitude deviations, frequency deviation, low group, frequency oscillation condition, programmable biquad, capacitor deviations, biquad coefficients, normal signal path, involved capacitors, generic oscillator, biquad structure, acceptability region, oscillation strategy, oscillation parameters, oscillator scheme, high fault coverage, oscillation conditions, convergent equilibrium, robust oscillations, stabilization phenomenon, transfer function coefficients, steering logic, symmetric oscillation, oscillator structure
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Mixed-Signal Circuits, Mathematical Review of Non-linear Oscillators, Oscillation-Based Test Methodology, Discrete-Time Filters, Monte Carlo, Design Decision, Low-Band Filter, Normal Random Distribution, Generic Form, Test Digital, All Samples, Power Down, High-Band Filter, Normal Mode, Building Block, Digital Evaluation Unit, Dialing Filter, Simple Solution, Amplitude Count, Fault Detail, Silicon Validation
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