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High Performance Instrumentation and Automation
 
 
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High Performance Instrumentation and Automation [Hardcover]

Patrick H. Garrett (Author)

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Book Description

0849337763 978-0849337765 May 26, 2005 1

Improvements in process control, such as defined-accuracy instrumentation structures and computationally intelligent process modeling, enable advanced capabilities such as molecular manufacturing. High Performance Instrumentation and Automation demonstrates how systematizing the design of instrumentation and automation leads to higher performance through more homogeneous systems, which are frequently assisted by rule-based, fuzzy logic, and neural network process descriptions.

Incorporate Advanced Performance Enhancements into Your Automation Enterprise

The book illustrates generic common core process-to-control concurrent engineering linkages applied to a variety of laboratory and industry automation systems. It outlines:

  • Product properties translated into realizable process variables
  • Axiomatic decoupling of subprocess variables for improved robustness
  • Production planner model-driven goal state execution
  • In situ sensor and control structures for attenuating process disorder
  • Apparatus tolerance design for minimizing process variabilities
  • Production planner remodeling based on product features measurement for quality advancement

Coverage also includes multisensor data fusion, high-performance computer I/O design guided by comprehensive error modeling, multiple sensor algorithmic error propagation, robotic axes volumetric accuracy, quantitative video digitization and reconstruction evaluation, and in situ process measurement methods.

High Performance Instrumentation and Automation reflects the experience of engineer and author Patrick Garrett, including his role as co-principal investigator for an Air Force intelligent manufacturing initiative.

You can download Analysis Suite.xls,, computer-aided design instrumentation software, available in the book's description on the CRC Press website.

 

 


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Inside This Book (learn more)
First Sentence:
Contemporary laboratory automation, manufacturing process control, analytical instrumentation, and aerospace systems all would have diminished capabilities without the availability of computer-integrated multisensor information structures. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
situ planner, situ subprocesses, intersample error, binary accuracy, data conversion devices, converter wordlength, presampling filter, active filter networks, aliasing attenuation, engineering linkages, process automation systems, apparatus variables, aperture error, situ references, situ control, integral nonlinearity, performance instrumentation, signal conditioning circuits, device error, instrumentation amplifier, source bands, proportional band, random interference, aperture time, sampled data systems
Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, University of Cincinnati, Prentice Hall, Master's Thesis, Artificial Intelligence, John Wiley, Subprocess Subprocess, Journal of Materials, Englewood Cliffs, Integral Time Derivative Time, Technical Report, Comment Sensor, Multisensor Instrumentation, Bessel Butterworth, End Cure, Quarter Decay Proportional Band, Trapezoidal Proportional Band
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