Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM [Hardcover]

R.F. Egerton (Author)

Book Description

Publication Date: August 3, 2005 | ISBN-10: 0387258000 | ISBN-13: 978-0387258003

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Editorial Reviews

Review

From the reviews: "This book comprises a concise introduction to the fundamental physical concepts of electron microscopy and related analytical techniques … . The concepts are well explained and illustrated, and in addition, the author offers a helpful introduction to microscopy, as a whole … . The text includes interesting historical tidbits and also alludes to more recent developments … . It is suitable for institutional or personal purchase." (Andreas Holzenburg, Microbiology Today, July, 2006) "R.F. Egerton … has now written a short book for beginners on electron microscopy in general: Physical Principles of Electron Microscopy, an Introduction to TEM, SEM, and AEM[10]. … Extremely simple language is used throughout and newcomers to the subject will be grateful for this text, designed to accompany a one-semester undergraduate course." (P. W. Hawkes, Ultramicroscopy, Vol. 107 (54), 2007)

From the Back Cover

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Product Details

• Hardcover: 214 pages
• Publisher: Springer (August 3, 2005)
• Language: English
• ISBN-10: 0387258000
• ISBN-13: 978-0387258003
• Product Dimensions: 9.4 x 6.3 x 0.6 inches
• Shipping Weight: 15.2 ounces (View shipping rates and policies)
• Amazon Best Sellers Rank: #1,346,410 in Books (See Top 100 in Books)
  • #53 in Books > Professional & Technical > Professional Science > Physics > Electron Microscopy

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