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A Practical Guide for the Preparation of Specimens for X-Ray Fluorescence and X-Ray Diffraction Analysis
 
 
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A Practical Guide for the Preparation of Specimens for X-Ray Fluorescence and X-Ray Diffraction Analysis [Hardcover]

Victor E. Buhrke (Editor), Ron Jenkins (Editor), Deane K. Smith (Editor)
5.0 out of 5 stars  See all reviews (1 customer review)

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Book Description

November 19, 1997 0471194581 978-0471194583 1
The first hands-on guide to XRD and XRF sampling and specimen preparation

Systematic errors from poor sampling and improper specimen preparation can easily render X-ray diffraction (XRD) and X-ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume.

This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in X-ray analysis - complete with theory, step-by-step methods, equipment suggestions, and problem-solving tips.

With a full complement of tools and techniques, this comprehensive guide helps both beginners and experienced analysts to make the best decision on sample treatment and get accurate XRD and XRF results-saving valuable time, money, and effort.

Covers X-ray techniques for analyzing biological, geological, metallic, ceramic, and other materials
* Addresses all aspects of specimen preparation, including handling unusual or very small samples, liquids and solutions, and more
* Features special chapters on specimen preparation equipment and XRF standards
* Contains useful bibliography and helpful references.

Frequently Bought Together

Customers buy this book with X-Ray Fluorescence Spectrometry (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications) $129.09

A Practical Guide for the Preparation of Specimens for X-Ray Fluorescence and X-Ray Diffraction Analysis + X-Ray Fluorescence Spectrometry (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications)
Price For Both: $304.75

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Editorial Reviews

From the Publisher

This book is the first to discuss specimen preparation for X-ray diffraction (XRD) and X-ray fluorescence (XRF), powerful analytical tools for determining molecular composition and structure. Written to help either beginners or experienced X-ray analysts, it offers detailed information on the correct ways to select a sample from a bulk material and prepare a specimen from the sample, thus avoiding serious and costly errors in analysis. Each chapter provides essential theoretical background, step-by-step methods, suggestions about finding necessary equipment needed, and recommended literature references.

From the Back Cover

The first hands-on guide to XRD and XRF sampling and specimen preparation

Systematic errors from poor sampling and improper specimen preparation can easily render X-ray diffraction (XRD) and X-ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume.

This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in X-ray analysis - complete with theory, step-by-step methods, equipment suggestions, and problem-solving tips.

With a full complement of tools and techniques, this comprehensive guide helps both beginners and experienced analysts to make the best decision on sample treatment and get accurate XRD and XRF results-saving valuable time, money, and effort.

Covers X-ray techniques for analyzing biological, geological, metallic, ceramic, and other materials
* Addresses all aspects of specimen preparation, including handling unusual or very small samples, liquids and solutions, and more
* Features special chapters on specimen preparation equipment and XRF standards
* Contains useful bibliography and helpful references.

Product Details

  • Hardcover: 360 pages
  • Publisher: Wiley-VCH; 1 edition (November 19, 1997)
  • Language: English
  • ISBN-10: 0471194581
  • ISBN-13: 978-0471194583
  • Product Dimensions: 9.5 x 6.1 x 0.8 inches
  • Shipping Weight: 1.1 pounds (View shipping rates and policies)
  • Average Customer Review: 5.0 out of 5 stars  See all reviews (1 customer review)
  • Amazon Best Sellers Rank: #1,233,818 in Books (See Top 100 in Books)

 

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5.0 out of 5 stars Is as it says, December 22, 2010
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This review is from: A Practical Guide for the Preparation of Specimens for X-Ray Fluorescence and X-Ray Diffraction Analysis (Hardcover)
This is a very thorough book discussing the practical aspects of sample preparation for XRD and XRF. This may seem rather banal or trivial, until one finds oneself with a sample mounting issue that biases, skews or otherwise corrupts the data.

Multiple authors contribute their shared experience to describe the best techniques, and they discuss the impact these techniques will have on the collected data.
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Inside This Book (learn more)
First Sentence:
In most analytical laboratories the analyst is presented with a sample for analysis, the sample, in turn, having been taken from the bulk. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
slurry mount, aerosol suspension chamber, micronizing mill, cavity mount, crystallite statistics, diffractometer axis, tetraborate flux, delimitation error, platinum ware, whole rock analysis, ignited sample, shatter box, powder briquettes, analytical surface, bath electrolyte, fused beads, lithium tetraborate, preferred orientation effects, specimen mount, equilibration chamber, divergence slit, spectral correction, grinding aid, diffraction trace, cow gum
Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, X-ray Anal, Spex Certi Prep Industries, X-ray Spectrom, John Wiley, Chemplex Industries, Supplies These, Ron Jenkins, Bico Braun, Bureau of Analyzed Samples, Somar Laboratories, The Gem Dugout, Thomas Scientific Instruments, Cargille Tab-Pro, Terra Scientific, Academic Press, Brammer Standard Company, Fisher Scientific, Light Metals, Van Grieken, X-ray Diffraction Procedures, Blake Industries, Boca Raton, Boekel Industries, Marcel Dekker
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