Have one to sell? Sell yours here
Practical Surface Analysis, Auger and X-ray Photoelectron Spectroscopy (Volume 1)
 
 
Tell the Publisher!
I'd like to read this book on Kindle

Don't have a Kindle? Get your Kindle here, or download a FREE Kindle Reading App.

Practical Surface Analysis, Auger and X-ray Photoelectron Spectroscopy (Volume 1) [Paperback]

D. Briggs (Editor), M. P. Seah (Editor)


Out of Print--Limited Availability.


Textbook Student FREE Two-Day Shipping for Students. Learn more

Formats

Amazon Price New from Used from
Hardcover --  
Paperback --  
Paperback, July 1996 --  

Book Description

0471953407 978-0471953401 July 1996 Volume 1
This is an updated manual covering the theory and practice of X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) techniques for surface analysis. Topics covered include historical development; all relevant theory for data interpretation and a description of instrumentation; the major fields of applications, such as metallurgy, polymers, semiconductors, and corrosion science; catalysis; and many appendices of essential data for day-to-day use. This new edition also takes into account improvements in equipment, experimental procedures and data interpretation over the last seven years.

Customers Who Viewed This Item Also Viewed


Editorial Reviews

From the Publisher

Since the publication of the first edition, practical surface analysis has grown and diversified to such an extent that the editors have found it necessary to produce a new companion volume to cover the fields of ion and neutral spectroscopy. This first volume of the two-volume set discusses two closely related analytical techniques--Auger and X-ray photoelectron spectroscopy. Beginning with historical background of both AES and XPS, it provides in-depth examination of theory and practice of the two techniques. Information on instrumentation, spectral interpretation, depth profiling and quantification are also included. Volume II also discusses the treatment of ion and neutral techniques, but in a different manner because they have less in common than the electron spectroscopies. Volume II includes material on SIMS Instrumentation, dynamic SIMS, and SNMS (sputtered neutral mass spectrometry). Both volumes have numerous appendices.

Product Details

  • Paperback: 674 pages
  • Publisher: John Wiley & Sons; Volume 1 edition (July 1996)
  • Language: English
  • ISBN-10: 0471953407
  • ISBN-13: 978-0471953401
  • Product Dimensions: 10.1 x 6.3 x 1.3 inches
  • Shipping Weight: 2.4 pounds
  • Amazon Best Sellers Rank: #7,361,452 in Books (See Top 100 in Books)

More About the Authors

Discover books, learn about writers, read author blogs, and more.

Customer Reviews


There are no customer reviews yet.
Video reviews
Video reviews
Amazon now allows customers to upload product video reviews. Use a webcam or video camera to record and upload reviews to Amazon.



Tag this product

 (What's this?)
Think of a tag as a keyword or label you consider is strongly related to this product.
Tags will help all customers organize and find favorite items.
Your tags: Add your first tag
 

Sell a Digital Version of This Book in the Kindle Store

If you are a publisher or author and hold the digital rights to a book, you can sell a digital version of it in our Kindle Store. Learn more

Customer Discussions

This product's forum
Discussion Replies Latest Post
No discussions yet

Ask questions, Share opinions, Gain insight
Start a new discussion
Topic:
First post:
Prompts for sign-in
 


Active discussions in related forums
Search Customer Discussions
Search all Amazon discussions
   
Related forums


Listmania!


Create a Listmania! list

So You'd Like to...


Create a guide


Look for Similar Items by Category


Look for Similar Items by Subject