This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable way, open both to those inexperienced in the technique, and also to practicing electron microscopists. He describes currently hot topics such as computer control of microscopes, energy-filtered imaging, cryomicroscopy and environmental microscopy, digital imaging, high resolution scanning, and transmission microscopy. The author has expanded the highly praised case studies of the first edition to include some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years' practical experience, will be invaluable to new and experienced electron microscopists in any area of science and technology.
FREE Two-Day Shipping for students on millions of items. Learn more |
| ||||||||||||||||||
Book Description
Editorial Reviews
Review
"This book combines the practical aspects of electron microscopy with just enough theory to capture the interests at all levels. The generous use of examples and the wealth of topics covered make this an attractive textbook for an introductory course in electron microscopy...The discussion of related analytical methods such as SEAM, Spin SEM, and FIM is very welcome in a book of this type and the appendix is also detailed and informative. In short, a reader will find in this book useful information about instrumentation and technique in very readable form, which can be understood and put into practice with a minimum of additional effort." Scanning, The Journal of Scanning Microscopies
"...a must read for any person interested in finding out about this broad discipline...a descriptive, visually oriented text, with many informative figures and stunning electron micrograph images." The Leading Edge
"...a must read for any person interested in finding out about this broad discipline...a descriptive, visually oriented text, with many informative figures and stunning electron micrograph images." The Leading Edge
Book Description
This completely revised new edition contains expanded coverage of existing topics as well as much new material. It covers computer controlled microscopes, energy-filtered imaging, cryo- and environmental microscopy, digital imaging, high resolution scanning and transmission microscopy.
Product Details
Would you like to update product info or give feedback on images?
|
More About the Author
Discover books, learn about writers, read author blogs, and more.
Customer Reviews
|
Share your thoughts with other customers:
|
||||||||||||||||||||||
|
Most Helpful Customer Reviews
3.0 out of 5 stars
Not bad, a bit outdated,
By R. M. "Nerd Alert" (Boston, MA) - See all my reviews
This review is from: The Principles and Practice of Electron Microscopy (Paperback)
Read through this book for a TEM/Diffraction class. I'd call it a decent undergraduate-level introduction. Topics are introduced in very general terms with plenty of diagrams, plots, and images. Not extremely well organized, and very few equations.
Share your thoughts with other customers: Create your own review
|
|
Inside This Book
(learn more)
First Sentence:
As the unaided human eye moves closer to an object it produces in the brain of the observer a progressively larger and more detailed image until the eye is about 25 cm from the object, at the so-called near point of the eye. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
electron microscope family, goniometer specimen stage, stereoscopic microscopy, vapour diffusion pumps, eucentric goniometer stage, third condenser lens, channelling patterns, emissive mode, lens bore, stub surface, detecting crystal, scanned frame, adsorption pumps, transmission micrograph, electron spot, scan rotation, gun voltage, replica film, final lens, specimen plane, pointed filament, electron lenses, specimen grid, final aperture, specimen tilt Key Phrases - Capitalized Phrases (CAPs): (learn more)
Electron Microscopy Ltd, Philips Electron Optics, Monte Carlo, Periodic Table, Sira Ltd, Bragg's Law, Intermediate Voltage, Kratos Ltd, Cambridge University New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
As the unaided human eye moves closer to an object it produces in the brain of the observer a progressively larger and more detailed image until the eye is about 25 cm from the object, at the so-called near point of the eye. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
electron microscope family, goniometer specimen stage, stereoscopic microscopy, vapour diffusion pumps, eucentric goniometer stage, third condenser lens, channelling patterns, emissive mode, lens bore, stub surface, detecting crystal, scanned frame, adsorption pumps, transmission micrograph, electron spot, scan rotation, gun voltage, replica film, final lens, specimen plane, pointed filament, electron lenses, specimen grid, final aperture, specimen tilt Key Phrases - Capitalized Phrases (CAPs): (learn more)
Electron Microscopy Ltd, Philips Electron Optics, Monte Carlo, Periodic Table, Sira Ltd, Bragg's Law, Intermediate Voltage, Kratos Ltd, Cambridge University New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 10
books:
See all 10 books this book cites
16
books
cite this book:
See all 16 books citing this book
- Procedures in Electron Microscopy by A. W. Robards on page 136, and Back Matter
- Advances in Optical and Electron Microscopy, Vol. 13 by Tom Mulvey in Back Matter
- Practical Methods in Electron Microscopy by A.M. Glauert on page 136
- Modern PhotoMICROgraphy (Royal Microscopical Society Microscopy Handbooks, 33) by Dr Brian Bracegirdle in Back Matter
- Modern Vacuum Practice by Nigel S. Harris in Back Matter
See all 10 books this book cites
- Performance and Durability Assessment:: Optical Materials for Solar Thermal Systems by Michael Kohl on page 270
- Experimental Methods in Tribology, Volume 44 (Tribology and Interface Engineering) by Gwidon Stachowiak on page 220
- Forensic Osteology: Advances in the Identification of Human, Second Edition by Kathleen J. Reichs on page 424
- Biophysics by V. Pattabhi in Back Matter
- Handbook of Molecular and Cellular Methods in Biology and Medicine, Second Edition by Leland J. Cseke on page 486
See all 16 books citing this book
Books on Related Topics
(learn more)
|
What Other Items Do Customers Buy After Viewing This Item?
Suggested Tags from Similar Products(What's this?)Be the first one to add a relevant tag (keyword that's strongly related to this product).
|
Sell a Digital Version of This Book in the Kindle Store
If you are a publisher or author and hold the digital rights to a book, you can sell a digital version of it in our Kindle Store.
Learn more
Customer Discussions
|
This product's forum
Active discussions in related forums
Search Customer Discussions
|
Related forums
|
