Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library) [Hardcover]

Keith B. Schaub (Author)

Book Description

ISBN-10: 1580536921 | ISBN-13: 978-1580536929 | Publication Date: March 31, 2004

Book InformationThe booming use of micro-chips that handle full functionality for a wireless application, coupled with the increasing number of integrated analog/digital wireless devices being developed, has created a need for the merger and rethinking of past testing approaches for wireless equipment. Addressing this issue head-on, this first-of-its-kind resource offers professionals an in-depth overview of cutting-edge RF (radio frequency) and SOC (system on a chip) product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. Practitioners learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices.ContentsIntroduction. The Radio Architecture in Wireless Telecommunications. Moving towards the System on a Chip (SOC). The Importance of Testing. Cost of Test. Production Testing of RF Devices. Production Testing of SOC Devices. Fundamentals of Analog and Mixed Signal Testing, Moving Beyond Traditional Production Testing, Noise Testing, Appendix.

Editorial Reviews

About the Author

Keith B. Schaub is a Wireless Center of Expertise Senior RF technical consultant at Agilent Technologies. Mr. Schaub has over 10 years of professional engineering experience and received his M.S. in Electrical Engineering from the University of Texas.

Joe Kelly is a Wireless Center of Expertise Senior RF technical consultant at Agilent Technologies. Dr. Kelly earned his Ph.D. and M.S. in Ceramic and Materials Engineering at Rutgers University. He is a frequent presenter at international conferences and workshops.

Product Details

• Hardcover: 272 pages
• Publisher: Artech House Publishers (March 31, 2004)
• Language: English
• ISBN-10: 1580536921
• ISBN-13: 978-1580536929
• Product Dimensions: 10.3 x 7 x 0.8 inches
• Shipping Weight: 1.4 pounds (View shipping rates and policies)
• Average Customer Review: 3.8 out of 5 stars  See all reviews (5 customer reviews)
• Amazon Best Sellers Rank: #389,515 in Books (See Top 100 in Books)
  • #99 in Books > Computers & Technology > Networking > Wireless Networks

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Customer Reviews

Most Helpful Customer Reviews

1 of 1 people found the following review helpful:

1.0 out of 5 stars Calibration section is useless, November 30, 2008

By 

Microwave Engineer (New Hampshire, USA) - See all my reviews

This review is from: Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library) (Hardcover)

Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library)

The author blows right by the topic of RF measurement system calibration and the analysis of measurement uncertainty. RF measurement system calibration techniques, is an essential topic if the Test Engineer is to be successful. Without this knowledge, the Test Engineer will become frustrated and deplete his/her resources when the time comes to correlate the test system measurements.
In addition; while performing a cursory review, I came across a misconception relating to S-Parameters. On pages 16 and 17, the author references a non-linear device (mixer) to explain the concept of S-Parameters. S-Parameters, by definition, are linear parameters; however, the author states the mixer's conversion loss, a non-linear parameter, is also S21. He is correct with respect to a 3-port device having nine (9) S-Parameters, however, S21 of the mixer is the IF isolation (rejection) with respect to the RF port and IF port respectfully. This statement is a complete misconception. S-Parameters is a fundamental concept, providing a solid base to RF and microwave engineering. It is apparent; the author does not understand the subject matter. To the neophyte, he looks like an authority. To the wiser, he is a snake-oil salesman and should not be allowed to publish fiction as a reference book. If you cannot run with the big dogs, then sit on the porch.

3.0 out of 5 stars Production Testing of RF and System-on-a-Chip Devices for Wireless Communications, February 8, 2008

By 

T. pham - See all my reviews
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Amazon Verified Purchase

This review is from: Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library) (Hardcover)

The title of the book is very attractive to a test engineer who wants to learn RF testing. The book includes and explains most of the RF terms albeit superficially. From reading the title I wish the author, who is an experience RF app/test engineer, could start with a simple pseudo or real RF device. Then the author could create the real test codes on either Agilent (the author is from Agilent) or a pseudo tester along with the explanation. So to make the book exact of its meaning: production.

5.0 out of 5 stars Great Book to have - for Current RF test - to be RF test Engineers., April 29, 2007

By 

Pustak Pasal (Dallas, Texas) - See all my reviews

This review is from: Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library) (Hardcover)

This book provide precise definition and concept about RF tests. The process included in this book covers allmost all techniques that are currently in use.
i have recently joined UWB -wireless R&D company as Test engineer. This book amazingly covers almost all the RF tests terms and concept that i have come through so far.
very good book to have