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5.0 out of 5 stars Great Book to have - for Current RF test - to be RF test Engineers.
This book provide precise definition and concept about RF tests. The process included in this book covers allmost all techniques that are currently in use.

i have recently joined UWB -wireless R&D company as Test engineer. This book amazingly covers almost all the RF tests terms and concept that i have come through so far.

very good book to have
Published on April 29, 2007 by Pustak Pasal

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1 of 1 people found the following review helpful:
1.0 out of 5 stars Calibration section is useless
Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library)

The author blows right by the topic of RF measurement system calibration and the analysis of measurement uncertainty. RF measurement system calibration techniques, is an essential topic if the Test Engineer is to be successful. Without this...
Published on November 30, 2008 by Microwave Engineer


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1 of 1 people found the following review helpful:
1.0 out of 5 stars Calibration section is useless, November 30, 2008
By 
Microwave Engineer (New Hampshire, USA) - See all my reviews
This review is from: Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library) (Hardcover)
Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library)

The author blows right by the topic of RF measurement system calibration and the analysis of measurement uncertainty. RF measurement system calibration techniques, is an essential topic if the Test Engineer is to be successful. Without this knowledge, the Test Engineer will become frustrated and deplete his/her resources when the time comes to correlate the test system measurements.

In addition; while performing a cursory review, I came across a misconception relating to S-Parameters. On pages 16 and 17, the author references a non-linear device (mixer) to explain the concept of S-Parameters. S-Parameters, by definition, are linear parameters; however, the author states the mixer's conversion loss, a non-linear parameter, is also S21. He is correct with respect to a 3-port device having nine (9) S-Parameters, however, S21 of the mixer is the IF isolation (rejection) with respect to the RF port and IF port respectfully. This statement is a complete misconception. S-Parameters is a fundamental concept, providing a solid base to RF and microwave engineering. It is apparent; the author does not understand the subject matter. To the neophyte, he looks like an authority. To the wiser, he is a snake-oil salesman and should not be allowed to publish fiction as a reference book. If you cannot run with the big dogs, then sit on the porch.
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3.0 out of 5 stars Production Testing of RF and System-on-a-Chip Devices for Wireless Communications, February 8, 2008
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This review is from: Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library) (Hardcover)
The title of the book is very attractive to a test engineer who wants to learn RF testing. The book includes and explains most of the RF terms albeit superficially. From reading the title I wish the author, who is an experience RF app/test engineer, could start with a simple pseudo or real RF device. Then the author could create the real test codes on either Agilent (the author is from Agilent) or a pseudo tester along with the explanation. So to make the book exact of its meaning: production.
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5.0 out of 5 stars Great Book to have - for Current RF test - to be RF test Engineers., April 29, 2007
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This review is from: Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library) (Hardcover)
This book provide precise definition and concept about RF tests. The process included in this book covers allmost all techniques that are currently in use.

i have recently joined UWB -wireless R&D company as Test engineer. This book amazingly covers almost all the RF tests terms and concept that i have come through so far.

very good book to have
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5.0 out of 5 stars Excellent resource for RF Test Engineers, August 1, 2006
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This review is from: Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library) (Hardcover)
I bought this book several years ago and it sat on my shelf until I recently became an test engineer. This book has been an excellent resource and its descriptions and explanations have been both concise and easy to understand. I would definitely recommend this book for prospective RF test engineers.
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1 of 4 people found the following review helpful:
5.0 out of 5 stars It's about time! Should be taught at the college level, April 26, 2004
By A Customer
This review is from: Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library) (Hardcover)
An excellent read for any up and coming engineer or any test floor manager hoping to better understand cost of test issues. The book also does a good job of bridging mixed signal with RF as they collide in the SOC world.
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Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library)
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