Progress in Transmission Electron Microscopy 2 [Hardcover]

Xiao-Feng Zhang (Editor), Ze Zhang (Editor)

Book Description

Series: Springer Series in Surface Sciences | Publication Date: December 12, 2001

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.

Editorial Reviews

From the Back Cover

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.

Product Details

• Hardcover: 321 pages
• Publisher: Springer; 1 edition (December 12, 2001)
• Language: English
• ISBN-10: 3540676813
• ISBN-13: 978-3540676812
• Product Dimensions: 9.4 x 6.1 x 0.7 inches
• Shipping Weight: 1.3 pounds (View shipping rates and policies)
• Amazon Best Sellers Rank: #10,098,572 in Books (See Top 100 in Books)