This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.
Quantitative X-ray Spectrometry: 20 (Practical Spectroscopy)
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Editorial Reviews
Review
International praise for the previous edition. . . . . .critically describes x-ray instrumentation and techniques. . .has one of the most extensive discussions of energy-dispersive x-ray spectrometry of any book.
---Analytical Chemistry
. . .a valuable compendium for the practicing x-ray spectroscopist in industry and science or researchers in other fields who have to apply x-ray analysis.
---Journal of Applied Crystallography
Ron Jenkins could. . .be described as the doyen of XRF and together with his colleagues R. W. Gould and Dale Gedcke brings vast wealth of experience to the subject of XRF. . .. . . .the main revisions to this second edition are the inclusion of details of layered synthetic microstructures, total reflection X-ray spectrometry, and the influence of the personal computer. . ..an important contribution to XRF and will be of interest to both new and established workers in this field.
---Journal of Analytical Atomic Spectrometry
---Analytical Chemistry
. . .a valuable compendium for the practicing x-ray spectroscopist in industry and science or researchers in other fields who have to apply x-ray analysis.
---Journal of Applied Crystallography
Ron Jenkins could. . .be described as the doyen of XRF and together with his colleagues R. W. Gould and Dale Gedcke brings vast wealth of experience to the subject of XRF. . .. . . .the main revisions to this second edition are the inclusion of details of layered synthetic microstructures, total reflection X-ray spectrometry, and the influence of the personal computer. . ..an important contribution to XRF and will be of interest to both new and established workers in this field.
---Journal of Analytical Atomic Spectrometry
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Inside This Book
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First Sentence:
The use of x-ray emission spectrometers for elemental analysis became widespread in the late 1950s and early 1960s. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
fluoresced intensity, deadtime losses, extending deadtime, characteristic anode lines, deadtime interval, integral discriminator threshold, pileup distortion, pileup spectrum, analyzable limit, lucite specimen, pulse height selector, paralyzable deadtime, pileup rejector, output logic pulse, preamplifier noise contribution, dashed pulse, photoelectric mass absorption coefficient, expected mean rate, counting ratemeter, isowatt curves, net peak counts, synchrotron source radiation, true counting rate, resistive feedback preamplifier, analyte line intensity Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, X-ray Spectrom, X-ray Anal, Anal Chem, Norelco Reporter, Counts Expanded, Electron Probe Analysis, Special Publication, Full Scale Normal, Kevex Corp, Department of Commerce, Oak Ridge, Plenum Press, Experimental Nuclear Physics, Government Printing Office, National Bureau of Standards, New Orleans, Proceedings of the Eighth National Conference, Siemens Rev, Synchrotron Radiation Research, The Atomic Nucleus New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
The use of x-ray emission spectrometers for elemental analysis became widespread in the late 1950s and early 1960s. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
fluoresced intensity, deadtime losses, extending deadtime, characteristic anode lines, deadtime interval, integral discriminator threshold, pileup distortion, pileup spectrum, analyzable limit, lucite specimen, pulse height selector, paralyzable deadtime, pileup rejector, output logic pulse, preamplifier noise contribution, dashed pulse, photoelectric mass absorption coefficient, expected mean rate, counting ratemeter, isowatt curves, net peak counts, synchrotron source radiation, true counting rate, resistive feedback preamplifier, analyte line intensity Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, X-ray Spectrom, X-ray Anal, Anal Chem, Norelco Reporter, Counts Expanded, Electron Probe Analysis, Special Publication, Full Scale Normal, Kevex Corp, Department of Commerce, Oak Ridge, Plenum Press, Experimental Nuclear Physics, Government Printing Office, National Bureau of Standards, New Orleans, Proceedings of the Eighth National Conference, Siemens Rev, Synchrotron Radiation Research, The Atomic Nucleus New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 36
books:
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29
books
cite this book:
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- Atomic Nucleus by Robley Dunglison Evans on page 38, page 81, and page 209
- X-Ray Diffraction (Dover Books on Physics) by B. E. Warren on page 38, page 211, and page 427
- Synchrotron Radiation Research by Herman Winick on page 5, and page 82
- Data Reduction and Error Analysis for The Physical Sciences by P. R. Bevington on page 211, and page 269
- Data Reduction and Error Analysis for the Physical Sciences by Philip Bevington on page 211, and page 269
See all 36 books this book cites
- X-Ray Fluorescence Spectrometry (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications) by Ron Jenkins on page 159, page 174, and page 186
- Advances in X-Ray Analysis, Vol. 39 by John V. Gilfrich on page 797, and page 879
- Hazardous Waste Measurements by Milagros S. Simmons on page 191, and page 207
- Introduction to X-Ray Powder Diffractometry by Ron Jenkins on page 6, and page 148
- Practical Gamma-Ray Spectrometry by Gordon Gilmore on page 271, and Back Matter
See all 29 books citing this book
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