This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (Mos), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
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Ron Schrimpf and Dan Fleetwood are world renowned experts in radiation effects ... This book is a great resource. -- Dr Peter S Winokur, Sandia National Laboratories
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Inside This Book
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First Sentence:
Radiation effects have long been one of the most serious issues in spacecraft and aviation electronics. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
linear bipolar circuits, bipolar linear circuits, enhanced low dose rate sensitivity, annular transistors, bipolar gain degradation, ionizing dose effects, radiation induced leakage current, displacement damage effects, threshold voltage matching, atmospheric neutrons, total dose effects, total dose degradation, dark current spikes, single event effects, single event transients, functional interrupt, displacement damage dose, parametric degradation, single event burnout, charge collection characteristics, hardness assurance, gate rupture, total dose damage, hardened oxide, trapped positive charge Key Phrases - Capitalized Phrases (CAPs): (learn more)
Nuclear Science, World Scientific Publishing Company, Electron Devices, New York, John Wiley, Monte Carlo, Electrochemical Soc, Goddard Space Flight Center, Microelectronics Reliability, Physics Research, Texas Instruments, Vanderbilt University, Defense Threat Reduction Agency, Journal of Solid-State Circuits, Total-Dose Hardening-By-Design Approach, University of Montpellier, North Holland, Semiconductor Electronics, Trans Nucl, Angle of Incidence, Compact Muon Solenoid, Digest of Papers, Micron Area, Oxford University Press, Port de Poncharra New!
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Front Cover | Table of Contents | First Pages | Back Cover | Surprise Me!
Radiation effects have long been one of the most serious issues in spacecraft and aviation electronics. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
linear bipolar circuits, bipolar linear circuits, enhanced low dose rate sensitivity, annular transistors, bipolar gain degradation, ionizing dose effects, radiation induced leakage current, displacement damage effects, threshold voltage matching, atmospheric neutrons, total dose effects, total dose degradation, dark current spikes, single event effects, single event transients, functional interrupt, displacement damage dose, parametric degradation, single event burnout, charge collection characteristics, hardness assurance, gate rupture, total dose damage, hardened oxide, trapped positive charge Key Phrases - Capitalized Phrases (CAPs): (learn more)
Nuclear Science, World Scientific Publishing Company, Electron Devices, New York, John Wiley, Monte Carlo, Electrochemical Soc, Goddard Space Flight Center, Microelectronics Reliability, Physics Research, Texas Instruments, Vanderbilt University, Defense Threat Reduction Agency, Journal of Solid-State Circuits, Total-Dose Hardening-By-Design Approach, University of Montpellier, North Holland, Semiconductor Electronics, Trans Nucl, Angle of Incidence, Compact Muon Solenoid, Digest of Papers, Micron Area, Oxford University Press, Port de Poncharra New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Back Cover | Surprise Me!
Citations (learn more)
This book cites 31
books:
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6
books
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- A30.5 Integrated Circuits Video by Thomson Delmar Learning on page 15, and page 43
- The Effects of Radiation on Electronic Systems by George C. Messenger on page 231, and page 275
- Analysis and Design of Analog Integrated Circuits (4th Edition) by Paul R. Gray on page 230
- Semiconductor Device Modeling by Giuseppe Massobrio on page 257
- Power MOSFETs: Theory and Applications by Duncan A. Grant on page 176
See all 31 books this book cites
- High Performance Devices: Proceedings of the 2004 IEEE Lester Eastman Conference on High Performance Devices, Rensselaer Polytechnic Institute, 4-6 ... (Selected Topics in Electronics and Systems) by Robert E., III Leoni in Front Matter
- Breakdown Phenomena in Semiconductors and Semiconductor Devices (Selected Topics in Electronics and Systems) by Michael Levinshtein in Front Matter
- Design of High-Speed Communication Circuits (Selcted Topics in Electronics and Systems) by Ramesh Harjani in Front Matter
- Sic Materials And Devices (Selected Topics in Electronics and Systems) by Michael Shur in Front Matter
- Radiation Defect Engineering (Selected Topics in Electronics and Systems) by Kozlovski Vitali in Front Matter
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