Reflection Electron Microscopy and Spectroscopy for Surface Analysis [Hardcover]

Zhong Lin Wang (Author)

Book Description

Publication Date: May 31, 1996 | ISBN-10: 0521482666 | ISBN-13: 978-0521482660

This book is a comprehensive review of the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS). The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy-loss spectra in different scattering geometries. This and many other features makes the book an important and timely addition to the materials science literature for researchers and graduate students in physics and materials science.

Editorial Reviews

Review

'A very complete review of all work performed in reflection electron microscopy with an exhaustive bibliography ... It forms an exciting support for the understanding of surface studies by reflection electron microscopy. Illustrated by many beautiful and pertinent REM images and well-designed line drawings, this book should certainly be useful for graduate students and scientists working on surface characterization.' Andre Rocher, Measurement Science & Technology

'For those with a TEM background it represents, perhaps, the definitive text for reflection methods ... extremely readable ... attractive style ... Dr. Wang is to be congratulated on writing a very accesible text. The book is thoroughly recommended.' John F. Watts, The Analyst

' ... a very pleasing volume which should attract new users to these techniques.' P. W. Hawkes, Ultramicroscopy

' ... this book provides a comprehensive review of theory, techniques and applications of reflection electron microscopy.' Aslib Book Guide

Book Description

In this book, RHEED, REM and REELS techniques are comprehensively reviewed for the first time. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. The book is written for materials scientists and graduate students and is entirely self-contained. FORTRAN source codes are provided for calculating crystal structure data and electron energy-loss spectra in different scattering geometries.

Product Details

• Hardcover: 456 pages
• Publisher: Cambridge University Press (May 31, 1996)
• Language: English
• ISBN-10: 0521482666
• ISBN-13: 978-0521482660
• Product Dimensions: 10 x 7.1 x 1.1 inches
• Shipping Weight: 2.4 pounds (View shipping rates and policies)
• Average Customer Review: 4.5 out of 5 stars  See all reviews (2 customer reviews)
• Amazon Best Sellers Rank: #3,945,908 in Books (See Top 100 in Books)

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Customer Reviews

Most Helpful Customer Reviews

4.0 out of 5 stars From: Analysis, 1997, September 3, 2000

By A Customer

This review is from: Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Hardcover)

The book describes the analytical techniques based on electron diffraction, reflection and imaging in the TEM (and STEM) for the analysis of materials surfaces. As with most texts dealing with analytical techniques these days it is awash with acronyms and the ones representing the candidate methodologies are frequently encountered. These are RHEED (reflection high energy electron diffraction), REM (reflection electron microscopy), SREM (scanning REM) and REELS (reflection electron energy loss spectroscopy). Many others are included, but the author is considerate enough to define them all in the early pages of his book. The dust-cover notes state that this is 'an entirely self-contained study' in which the 'theories, techniques and applications of REM, RHEED and REELS are comprehensively reviewed'. Inspection of the text reveals that this is, indeed, the case, with three parts (logically Part A, Part B and Part C) of approximately equal length covering the three areas of reflection electron studies. This is preceded by a comprehensive review of the kinematical theory of electron diffraction. This chapter is a very helpful (and necessary) prelude to the rest of the book. It deals with kinematical scattering in the usual numerical manner but the associated text makes this chapter extremely readable. The main body of the text is written in an equally attractive style with the theory of the various topics being introduced alongside the experimental procedures involved. There are many applications of reflection electron microscopy and spectroscopy scattered throughout the book; although inmost cases they serve as illustrations of particular facets of the experimental procedures rather than points which emphasize the relative strengths of the candidate techniques. This is, however, a minor criticism, and the inclusion of examples of real micrographs, diffraction patterns and spectra throughout the text may provide some readers with much needed relief from the undoubted rigour of the theoretical treatments provided.

For those with a TEM background it represents, perhaps, the definitive text for reflection methods.

There are two particularly attractive aspects of this book to be found in the closing pages. The first is an extensive set (ten) of appendices which contain much useful data along with five FORTRAM programs for interpreting spectra and modeling electron beam/specimen interaction. These have presumably been widely tested in the author's laboratory and their inclusion here is to be welcomed. The other feature, warmly welcomed by this reviewer, is the inclusion of a separate index of the materials used to illustrate the various facets of the reflection techniques. Also included as an Appendix is a chronological bibliography of REM, SREM and REELS covering the years 1975-1995. RHEED is presumably excluded as it is the most senior, and widely used, of the methods considered. This book is not one for those with a peripheral interest in RHEED, REM, SREM and REELS. Referring once again to the cover notes it is offered as an 'ideal guide for scientists and graduate students working on quantitative surface structure characterization using reflection electron techniques' and there is no doubt that this target audience will appreciate the publication of such a concise, authoritative and well written text in their chosen area of endeavor. For those with a TEM background it represents, perhaps, the definitive text for reflection methods and provides all the theoretical information necessary for a thorough appreciation of these techniques. At such a reasonable price for a very specialist text one would hope that it will soon find a place on the bookshelf of every electron microscopy unit with a practical need (or even aspirations) to carry out surface structure determination in the TEM or STEM. For those with a need for such a text this book fulfills all the claims made on its behalf. Dr. Wang is to be congratulated on writing a very accessible text. The book is thoroughly recommended.

5.0 out of 5 stars A book you must have, September 3, 2000

By 

reader - See all my reviews

This review is from: Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Hardcover)

"It contains a lot of illustrations and excellent images and a good balance of theory and experimental techniques... it is a book that any materials science or physics libraries should be holding"