A guide to implementing and operating a practical reliability program using carefully designed experiments to provide information quickly, efficiently and cost effectively. It emphasizes real world solutions to daily problems. The second edition contains a special expanded section demonstrating how to combine accelerated testing with design of experiments for immediate improvement.
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Editorial Reviews
Review
Praise for the first edition... ...integrat[es] two very challenging subjects in a cohesive fashion.... ...the reliability professional looking for 'a feel' of how experimental design can be used to set up product reliability programs will be pleased with this book.
---Technometrics
...useful for introducing the value of reliability experiments and design.... ...recommend[ed] as an overview of the subject.
---Journal of Quality Technology
...very readable.
---Quality and Reliability Engineering International
---Technometrics
...useful for introducing the value of reliability experiments and design.... ...recommend[ed] as an overview of the subject.
---Journal of Quality Technology
...very readable.
---Quality and Reliability Engineering International
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Inside This Book
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First Sentence:
A long time ago, back in the "good old days," engineering was considered the art and science of making trade-offs. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
outer array factors, inner array factors, accumulated device hours, algebraic maxima, peak force ratio, upgrading columns, wave solder experiment, temperature cycling ranges, main effects experiment, fractional factorial array, deterministic reliability, accelerated reliability testing, single failure mechanism, step stress testing, lognormal plot, reliability engineering international, capacitor experiment, confirmation run, failure rate distribution, infant mortality region, percent voids, experimental array, reliability discipline, infant mortality failures, outer arrays Key Phrases - Capitalized Phrases (CAPs): (learn more)
John Wiley, American Supplier Institute, International Reliability Physics Symposium, New York, Quality Engineering, Journal of Quality Technology, Manufacturing Technology, Portola Valley, Reliability Analysis Center, Technology Associates, Englewood Cliffs, Journal of Applied Mechanics, National Technical Information Service, World War, Cycled Random, Design Reliable Products, Electronic Components Conference, Heavy Light, Prentice Hall, Reliability Engineering Handbook, Santa Clara, Stance Open Closed, Temperature Hot Cold New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
A long time ago, back in the "good old days," engineering was considered the art and science of making trade-offs. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
outer array factors, inner array factors, accumulated device hours, algebraic maxima, peak force ratio, upgrading columns, wave solder experiment, temperature cycling ranges, main effects experiment, fractional factorial array, deterministic reliability, accelerated reliability testing, single failure mechanism, step stress testing, lognormal plot, reliability engineering international, capacitor experiment, confirmation run, failure rate distribution, infant mortality region, percent voids, experimental array, reliability discipline, infant mortality failures, outer arrays Key Phrases - Capitalized Phrases (CAPs): (learn more)
John Wiley, American Supplier Institute, International Reliability Physics Symposium, New York, Quality Engineering, Journal of Quality Technology, Manufacturing Technology, Portola Valley, Reliability Analysis Center, Technology Associates, Englewood Cliffs, Journal of Applied Mechanics, National Technical Information Service, World War, Cycled Random, Design Reliable Products, Electronic Components Conference, Heavy Light, Prentice Hall, Reliability Engineering Handbook, Santa Clara, Stance Open Closed, Temperature Hot Cold New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 52
books:
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32
books
cite this book:
See all 32 books citing this book
- Accelerated Testing by Nelson on page 251, page 263, and page 344
- Reliability Engineering Handbook (Volume 2) by Dimitri Kececioglu on page 162, page 178, and page 226
- Value-added Management with Design of Experiments (IFIP) by L.W. Condra on page 46, and page 88
- Statistical Process Control (Quality and Reliability) by Berger in Front Matter (1), and Front Matter (2)
- Quality By Experimental Design, 3rd Edition (Quality and Reliability) by Thomas B. Barker in Front Matter (1), and Front Matter (2)
See all 52 books this book cites
- Electronic Component Reliability: Fundamentals, Modelling, Evaluation, and Assurance (Quality and Reliability Engineering Series) by Finn Jensen on page 132, and page 288
- Reliability Engineering Handbook (Quality and Reliability) by DodsoN/NolaN in Front Matter (1), and Front Matter (2)
- Product Development and Design for Manufacturing (Quality and Reliability) by John Priest in Front Matter (1), and Front Matter (2)
- Response Modeling Methodology: Empirical Modeling for Engineering and Science (Series on Quality, Reliability and Engineering Statistics) by Haim Shore on page 147, and page 248
- Response Surface Methodology: Process and Product Optimization Using Designed Experiments (Wiley Series in Probability and Statistics) by Raymond H. Myers in Back Matter
See all 32 books citing this book
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