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Resolution Enhancement Techniques in Optical Lithography (SPIE Tutorial Texts in Optical Engineering Vol. TT47)
 
 
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Resolution Enhancement Techniques in Optical Lithography (SPIE Tutorial Texts in Optical Engineering Vol. TT47) [Paperback]

Alfred Kwok-Kit Wong (Author)

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Book Description

0819439959 978-0819439956 March 15, 2001
This tutorial summarizes optical lithography enhancement research and development over the past 20 years. Discusses theoretical and practical aspects of commonly used techniques, including optical imaging and resolution, modified illumination, optical proximity correction, alternating and attenuating phase-shifting masks, selecting RETs, and second-generation RETs. Useful for students and practicing lithographers.

Contents

- Foreword
- Preface
- List of symbols
- Introduction
- Optical imaging and resolution
- Modified illumination
- Optical proximity correction
- Alternating phase-shifting mask
- Attenuated phase-shift mask
- Selecting appropriate RETs
- Second-generation RETs
- Concluding remarks
- k1 conversion charts
- Bibliography
- Index


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Resolution Enhancement Techniques in Optical Lithography (SPIE Tutorial Texts in Optical Engineering Vol. TT47) + Fundamental Principles of Optical Lithography: The Science of Microfabrication + Field Guide to Optical Lithography (SPIE Vol. FG06)
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Inside This Book (learn more)
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
selective line biasing, large partial coherence factor, optical interaction range, photoresist tone, partial coherence factors, lithography performance, quadrupole illumination, mask spectrum, mask error factors, inspection wavelength, bit line contact, process latitude, aberration sensitivity, bias increment, dipole illumination, threshold resist, annular illumination, traditional lithography, intensity imbalance, trim mask, pupil filter, assist features, lithography approaches, coherent imaging, optical proximity correction
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Selecting Appropriate, Ralf Schuster, Attenuated Phase-Shifting Mask, Photoresist Development
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Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
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