Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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Editorial Reviews
Review
"...this book is both linguistically and scientifically outstanding. It is an inspiring book for beginners and experienced SEM operators alike. The list of references is especially useful. This volume makes an outstanding contribution to the deeper understanding of the SEM."
T Mulvey, Measurement Science and Technology. 11, No12, December 2000
From the Back Cover
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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1 of 1 people found the following review helpful:
5.0 out of 5 stars
A very good book,
By
This review is from: Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences) (Hardcover)
This is one of the self-complete books on SEM and the related techniques for intermediate and advanced level of the SEM users or engineers.
With a huge list of references, the book explains almost all of the details of instrumentation, electron beam optics, detector strategy, physics of electron-specimen interaction, and practical applications of SEM-based imaging/analyzing techniques. While some of the references cited are German literatures, the book provides the best guide for the SEM techniques and the underlyiong physics for wide range of readers. I recommend it.
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Inside This Book
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First Sentence:
Unlike transmission electron microscopy (TEM) described in the counterpart to this book [1.1], scanning electron microscopy (SEM) can image and analyse bulk specimens [1.2-28]. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
stationary electron probe, biased collector grid, electron impact point, exit momenta, electron channelling patterns, electron diffusion cloud, total rate imaging, tron probe microanalysis, channelling contrast, electron backscattering patterns, electron mirror microscopy, panorama diagram, retarding curve, capacitive coupling voltage contrast, negatively biased grid, polepiece gap, positively biased grid, overvoltage ratio, detector strategy, gun brightness, hackscattering coefficient, exit depth, angular selection, electron incidence, multiple detector systems Key Phrases - Capitalized Phrases (CAPs): (learn more)
Monte Carlo, Electron Detectors, Special Techniques, Everhart Thornley, Crystal Structure Analysis, Numerical Example, Coster Kronig, Specimen Fig, Banbury Nixon, Low-Energy Spectroscopies, Structure Two New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Unlike transmission electron microscopy (TEM) described in the counterpart to this book [1.1], scanning electron microscopy (SEM) can image and analyse bulk specimens [1.2-28]. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
stationary electron probe, biased collector grid, electron impact point, exit momenta, electron channelling patterns, electron diffusion cloud, total rate imaging, tron probe microanalysis, channelling contrast, electron backscattering patterns, electron mirror microscopy, panorama diagram, retarding curve, capacitive coupling voltage contrast, negatively biased grid, polepiece gap, positively biased grid, overvoltage ratio, detector strategy, gun brightness, hackscattering coefficient, exit depth, angular selection, electron incidence, multiple detector systems Key Phrases - Capitalized Phrases (CAPs): (learn more)
Monte Carlo, Electron Detectors, Special Techniques, Everhart Thornley, Crystal Structure Analysis, Numerical Example, Coster Kronig, Specimen Fig, Banbury Nixon, Low-Energy Spectroscopies, Structure Two New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 45
books:
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6
books
cite this book:
See all 6 books citing this book
- Energy-Filtering Transmission Electron Microscopy (Springer Series in Optical Sciences) by Ludwig Reimer in Front Matter, and Back Matter
- Polarized Electrons (Springer Series on Atomic, Optical, and Plasma Physics) by Joachim Kessler in Back Matter (1), and Back Matter (2)
- Cell Biology by Edwards in Back Matter
- Silver-Halide Recording Materials: for Holography and Their Processing (Springer Series in Optical Sciences) by Hans I. Bjelkhagen in Front Matter
- Matrix Theory of Photoelasticity (Springer series in optical sciences ; v. 11) by Pericles S. Theocaris in Back Matter
See all 45 books this book cites
- Scanning Electron Microscopy and X-ray Microanalysis by Joseph Goldstein on page 272, and page 566
- Introduction to Texture Analysis: Macrotexture, Microtexture and Orientation Mapping by Valerie Randle in Back Matter
- Electron Backscatter Diffraction in Materials Science by Adam J. Schwartz on page 89
- Industrial Applications Of Electron Microscopy (Encyclopedia of Library & Info) by Zhigang Li on page 276
- Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003 (Institute of Physics Conference Series) by S McVitie on page 184
See all 6 books citing this book
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