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1 of 1 people found the following review helpful:
5.0 out of 5 stars A very good book, July 21, 2008
By 
Makoto Suzuki (San Jose, CA USA) - See all my reviews
(REAL NAME)   
This review is from: Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences) (Hardcover)
This is one of the self-complete books on SEM and the related techniques for intermediate and advanced level of the SEM users or engineers.
With a huge list of references, the book explains almost all of the details of instrumentation, electron beam optics, detector strategy, physics of electron-specimen interaction, and practical applications of SEM-based imaging/analyzing techniques.

While some of the references cited are German literatures, the book provides the best guide for the SEM techniques and the underlyiong physics
for wide range of readers.

I recommend it.
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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
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