Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists [Hardcover]

Joseph Goldstein (Author), Dale E. Newbury (Author), Patrick Echlin (Author), David C. Joy (Author), Alton D. Romig Jr. (Author), Charles E. Lyman (Author), Charles Fiori (Author), Eric Lifshin (Author)

Editorial Reviews

Review

From a review of the first edition:
`The emphasis throughout has been on practical aspects ... that approach, plus the comprehensiveness of the material covered, makes this a valuable, virtually indispensible, reference work.'
Microscope Journal

Product Details

• Hardcover: 840 pages
• Publisher: Springer; 2nd edition (May 31, 1992)
• Language: English
• ISBN-10: 0306441756
• ISBN-13: 978-0306441752
• Product Dimensions: 10.2 x 7.6 x 2 inches
• Shipping Weight: 4.3 pounds
• Average Customer Review: 5.0 out of 5 stars  See all reviews (4 customer reviews)
• Amazon Best Sellers Rank: #1,048,349 in Books (See Top 100 in Books)
  • #47 in Books > Professional & Technical > Professional Science > Physics > Electron Microscopy

Customer Reviews

Most Helpful Customer Reviews

11 of 11 people found the following review helpful:

5.0 out of 5 stars Excellent resource for Electron Microscopists, February 19, 1999

By 

Lisa Donaghe ([e-mail]) (New Mexico, USA) - See all my reviews

This review is from: Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists (Hardcover)

This book, although not the newest textbook on the market, is THE textbook to have if you are looking for the history, theory or applications of electron microscopy and x-ray microanalysis. Well written, thorough and packed full of well-designed diagrams illustrating the principles described. I've used this textbook in classroom and laboratory settings with excellent results. Looking forward to the next edition!

5 of 5 people found the following review helpful:

5.0 out of 5 stars Excellent text, October 12, 2000

By 

cmpst52 "cmpst52" (Denton, NC United States) - See all my reviews

This review is from: Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists (Hardcover)

Goldstein et al have written a book that serves as an excellent introduction to the SEM, and is also a formidable reference. When I took SEM at NC State University, it was taught from this book. Between our professor and this text, I learned the ins and outs of the SEM, and I keep the book within arms reach whenever I'm at work.

Goldstein covers everything from the basics of operation, through image formation, sample prep, usage in particular fields of study -- everything!

If you get one SEM book, get this one.

3 of 3 people found the following review helpful:

5.0 out of 5 stars A very good text book to own, September 21, 2000

By 

Dev Banerjee (USA) - See all my reviews
(REAL NAME)   

This review is from: Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists (Hardcover)

This is an excellent textbook for graduate students majoring in Materials Science. The text is easy to read, and accompanied by plenty of photographs and schematics, is easy to understand. Covers almost every aspect of SEM and X-ray micro-analysis e.g. underlying science, technology, and practical use. Each chapter begins at a basic level and gradually develops the subject to intricate detail, and depending on the level of study one may skip chapters or part of a chapter.