This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
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Editorial Reviews
Review
"There is no other single volume that covers as much theory and practice of SEM or X-ray microanalysis as Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition does. It is clearly written [and] well organized[.]... This is a reference text that no SEM or EPMA laboratory should be without." --Thomas J. Wilson, in Scanning, Vol. 27, No. 4, July/August 2005 "As the authors pointed out, the number of equations in the book is kept to a minimum, and important conceptions are also explained in a qualitative manner. A lot of very distinct images and schematic drawings make for a very interesting book and help readers who study scanning electron microscopy and X-ray microanalysis. The principal application and sample preparation given in this book are suitable for undergraduate students and technicians learning SEEM and EDS/WDS analyses. It is an excellent textbook for graduate students, and an outstanding reference for engineers, physical, and biological scientists." (Microscopy and Microanalysis, 9:5 (October 2003)
About the Author
This text is written by a team of authors associated with SEM and X-ray Microanalysis Courses presented as part of the Lehigh University Microscopy Summer School. Several of the authors have participated in this activity for more than 30 years.
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Most Helpful Customer Reviews
4 of 4 people found the following review helpful:
5.0 out of 5 stars
The Bible of All Scanning Electron Microscopy Books,
By Phillip "amazon_phil" (Philadephia, PA) - See all my reviews
Amazon Verified Purchase(What's this?)
This review is from: Scanning Electron Microscopy and X-ray Microanalysis (Hardcover)
If you are like me and had to use a Scanning Electron Microscope or SEM, you want to start with the basics that everyone goes by. This book is a safe bet that most everyone knows about. Plus, it is written with very little background in the world of electron microscopy. Too many authors to list but it's wonderful that alot of experts got together to present this material in clear, concise manner. Before you grab your solid-state physics book or check Wikipedia, just relax and page through it since this book pretty much makes it easy for you.
Chapters are arranged by the following: What is SEM?, How SEM works?, and Why are we interested with SEM? That's the easiest way to explain rather than list all the chapters. If you have a specific question, you don't even have to read through the previous chapters (if you have rough understanding). The size of this book is a BIG PLUS. It's compact compared to the monsterous Transmission Electron Microscopy (TEM) book by Barry Carter which is another great reference. For this price, you would be lucky to find another good reference book under $100 with such relevant information.
1 of 1 people found the following review helpful:
5.0 out of 5 stars
Awsome book for Scanning Electron Microscopy and X-Ray Analysis,
By
This review is from: Scanning Electron Microscopy and X-ray Microanalysis (Hardcover)
This book covers almost all aspects of the subject and the CD attached covers the recent development in the field.
This is the book one should have for the subject.
4.0 out of 5 stars
A must for SEM users,
Amazon Verified Purchase(What's this?)
This review is from: Scanning Electron Microscopy and X-ray Microanalysis (Hardcover)
To use SEM and its accessories one must have a through knowledge
about what is happening inside this column of electrons. This book is a good gate for the tower of SEM which many people uses but a few actually have enough knowledge how to use it efficiently
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Inside This Book
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First Sentence:
The scanning electron microscope (SEM) permits the observation and characterization of heterogeneous organic and inorganic materials on a nanometer (nm) to micrometer (m) scale. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
initial electron beam energy, gas path length, slushy nitrogen, electron trajectory simulation, including experimental protocols, passive scintillator, critical ionization energy, electron channeling contrast, critical excitation energy, beam impact point, final probe size, primary cryogen, input count rate, secondary cryogen, normal beam incidence, initial beam energy, snorkel lens, atomic number correction, analytical total, standardless analysis, atomic number effect, grid cap, thermionic system, cold field emitter, multiple linear least squares Key Phrases - Capitalized Phrases (CAPs): (learn more)
Monte Carlo, New York, San Francisco, Plenum Press, Academic Press, Research Institute, International Conference, Microbeam Analysis, Desktop Spectrum Analyzer, International Congress, University of Cambridge, Beam Limiting Aperture, Government Printing Office, Low High, National Bureau of Standards Special Publication, Object Point, Reference Material, Society of Petroleum Engineers, Courtesy of Rontec Instruments, Courtesy of Tony Burgess, Metals Park, Microcharacterization of Semiconductors, Multi-Imaging Centre, Oxford University Press, Scanning Microsc New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
The scanning electron microscope (SEM) permits the observation and characterization of heterogeneous organic and inorganic materials on a nanometer (nm) to micrometer (m) scale. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
initial electron beam energy, gas path length, slushy nitrogen, electron trajectory simulation, including experimental protocols, passive scintillator, critical ionization energy, electron channeling contrast, critical excitation energy, beam impact point, final probe size, primary cryogen, input count rate, secondary cryogen, normal beam incidence, initial beam energy, snorkel lens, atomic number correction, analytical total, standardless analysis, atomic number effect, grid cap, thermionic system, cold field emitter, multiple linear least squares Key Phrases - Capitalized Phrases (CAPs): (learn more)
Monte Carlo, New York, San Francisco, Plenum Press, Academic Press, Research Institute, International Conference, Microbeam Analysis, Desktop Spectrum Analyzer, International Congress, University of Cambridge, Beam Limiting Aperture, Government Printing Office, Low High, National Bureau of Standards Special Publication, Object Point, Reference Material, Society of Petroleum Engineers, Courtesy of Rontec Instruments, Courtesy of Tony Burgess, Metals Park, Microcharacterization of Semiconductors, Multi-Imaging Centre, Oxford University Press, Scanning Microsc New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 39
books:
See all 39 books this book cites
96
books
cite this book:
See all 96 books citing this book
- Electron Microprobe (Electro-chemical Society) by T.D. McKinley on 4 pages
- Electron Probe Quantitation by K.F.J. Heinrich on 4 pages
- Electron Backscatter Diffraction in Materials Science by Adam J. Schwartz on page 20, page 271, and page 566
- Microbeam Analysis by Richard Linton on page 451, and page 537
- Advanced Scanning Electron Microscopy and X-Ray Microanalysis by Patrick Echlin on page 98, and page 271
See all 39 books this book cites
- Surface Modification Engineering Fundamental Aspects by Ram Kossowsky on 6 pages
- Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) by David B. Williams on 5 pages
- Application of Cathodoluminescence Imaging to the Study of Sedimentary Rocks by Sam Boggs Jr on 4 pages
- Scanning and Transmission Electron Microscopy: An Introduction by Stanley L. Flegler on 4 pages
- Industrial Applications Of Electron Microscopy (Encyclopedia of Library & Info) by Zhigang Li on 4 pages
See all 96 books citing this book
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