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Scanning Microscopy for Nanotechnology: Techniques and Applications
 
 
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Scanning Microscopy for Nanotechnology: Techniques and Applications [Hardcover]

Weilie Zhou (Editor), Zhong Lin Wang (Editor)


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Book Description

November 27, 2006 0387333258 978-0387333250 1
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

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From the Back Cover

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.

Product Details

  • Hardcover: 536 pages
  • Publisher: Springer; 1 edition (November 27, 2006)
  • Language: English
  • ISBN-10: 0387333258
  • ISBN-13: 978-0387333250
  • Product Dimensions: 9.5 x 6.3 x 1.1 inches
  • Shipping Weight: 2.2 pounds
  • Amazon Best Sellers Rank: #2,116,503 in Books (See Top 100 in Books)

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Inside This Book (learn more)
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
photonic crystals, crustal growth, colloid wires, relative channel size, scanned electron microscopy, polar nanobelt, porous wires, surface normal texture, structured tips, milled lines, lacey carbon film, metal oxide nanostructures, copper nanowires, colloid crystals, electron backscatter diffraction, colloid spheres, beam blanker, opal structure, ferrite films, vitreous water, lithography system, tungsten probe, composite scaffolds, crystal wires, nanowire arrays
Key Phrases - Capitalized Phrases (CAPs): (learn more)
American Chemical Society, Nano Lett, Gabriel Caruntu, Weilie Zhou, One-dimensional Wurtzite Semiconducting Nanostructures, Peng Wang, Scanning Transmission Electron Microscopy, Fundamentals of Scanning Electron Microscopy, Bioinspired Nanomaterials, New York, Joe Nabity, E-Beam Nanolithography, Nano-building Blocks Fabricated, X-ray Microanalysis, Cryotemperature Stages, John Wiley, Robert Anderhalt, Nanostructural Research, Royal Society of Chemistry, David Frey, American Institute of Physics, Kluwer Academic, Brandon Van Leer, Monte Carlo, Lightwave Technol
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