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Scanning Probe Lithography (Microsystems, Volume 7)
 
 
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Scanning Probe Lithography (Microsystems, Volume 7) [Hardcover]

Hyongsok T. Soh (Author), Kathryn Wilder Guarini (Author), Calvin F. Quate (Author)

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Book Description

June 30, 2001 0792373618 978-0792373612 1
Scanning Probe Lithography (SPL) describes recent advances in the field of scanning probe lithography, a high resolution patterning technique that uses a sharp tip in close proximity to a sample to pattern nanometer-scale features on the sample. SPL is capable of patterning sub-30nm features with nanometer-scale alignment registration. It is a relatively simple, inexpensive, reliable method for patterning nanometer-scale features on various substrates. It has potential applications for nanometer-scale research, for maskless semiconductor lithography, and for photomask patterning. The authors of this book have been key players in this exciting new field. Calvin Quate has been involved since the beginning in the early 1980s and leads the research time that is regarded as the foremost group in this field. Hyongsok Tom Soh and Kathryn Wilder Guarini have been the members of this group who, in the last few years, have brought about remarkable series of advances in SPM lithography. Some of these advances have been in the control of the tip which has allowed the scanning speed to be increased from mum/second to mm/second. Both non-contact and in-contact writing have been demonstrated as has controlled writing of sub-100 nm lines over large steps on the substrate surface. The engineering of a custom-designed MOSFET built into each microcantilever for individual current control is another notable achievement. Micromachined arrays of probes each with individual control have been demonstrated. One of the most intriguing new aspects is the use of directly-grown carbon nanotubes as robust, high-resolution emitters. In this book the authors concisely and authoritatively describe the historical context, the relevant inventions, and the prospects for eventual manufacturing use of this exciting new technology.

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Inside This Book (learn more)
First Sentence:
Semiconductor lithography is the patterning process used to define the structures that make up integrated circuits (ICs). Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
different resist thicknesses, chrome evaporation, exposure dose control, pixel writing scheme, integrated current source, electron exposure dose, printed line width, gate contact pad, patterned line width, tip scan speed, organic polymer resists, isolated line width, scanning probe lithography, cantilever chip, absorbed energy density, noncontact case, parallel lithography, piezotube scanner, oxidation sharpening, microscope lithography, integrated transistor, underlying silicon substrate, line width data, lithography requirements, top silicon layer
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Stanford University, New York, Park Scientific Instruments, San Jose, Semiconductor Industry Association, Academic Press, Tungsten Resistor
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