Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.
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"This book provides a nice and clearly written introduction to scanning probe microscopy (SPM), which includes atomic force microscopy, scanning tunneling microscopy, and scanning near field microscopy."
--Mircea Dragoman, Optics & Photonics News, September 2005, Vol. 16 No. 9
From the Back Cover
Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.
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Solid Background to SPM,
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This review is from: Scanning Probe Microscopy: The Lab on a Tip (Hardcover)
Scanning Probe Microscopy: The Lab on a Tip by Ernst Meyer covers the two main techniques of SPM: STM and AFM (here called SFM). There is also a detailed section on Magnetic Force Microscopy(MFM). There are shorther sections on the less well known techniques, i.e. friction force microsocpy, SNOM, etc. The books covers the theory well, and is reasonably up to date as I write in 2007. The figures are clear, and the few microgrpahs presented in clear greyscale. There are relatively few applications, but these are easy to find elsewhere. Overall, a great book for the theory of SPM.
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tapping mode force microscopy, constant control interaction, sample stray field, resistance microscopy, probing tip, dynamic force microscopy, scanning ion conductance microscopy, force microscopy experiments, tip artifact, vibrational isolation, true atomic resolution, atomic friction, photoemission microscopy, scanning thermal microscopy, capacitance microscopy, noncontact atomic force microscopy, magnetic force microscopy, tip sample forces, friction force microscopy, corrugation heights, atomic periodicity, magnetic force microscope, cantilever oscillation, tip magnetization, tip sample distance Key Phrases - Capitalized Phrases (CAPs): (learn more)
Observation of Confined Electrons, Novel Sensors Based New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
- Noncontact Atomic Force Microscopy by S. Morita in Back Matter (1), and Back Matter (2)
- Scanning Tunneling Microscopy (Methods of Experimental Physics) by Joseph A. Stroscio on page 30, and Back Matter
- Scanning Tunneling Microscopy and Related Methods (NATO Science Series E: (closed)) by R.J. Behm in Back Matter (1), and Back Matter (2)
- Contact Mechanics by K. L. Johnson in Back Matter
- Procedures in Scanning Probe Microscopies by Richard J. Colton in Back Matter
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