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Scanning Transmission Electron Microscopy: Imaging and Analysis Hardcover – March 22, 2011

ISBN-13: 978-1441971999 ISBN-10: 1441971998 Edition: 2011th

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Scanning Transmission Electron Microscopy: Imaging and Analysis + Electron Energy-Loss Spectroscopy in the Electron Microscope + Aberration-corrected Imaging in Transmission Electron Microscopy: An Introduction
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Product Details

  • Hardcover: 762 pages
  • Publisher: Springer; 2011 edition (March 22, 2011)
  • Language: English
  • ISBN-10: 1441971998
  • ISBN-13: 978-1441971999
  • Product Dimensions: 10.1 x 7.2 x 1.4 inches
  • Shipping Weight: 3.8 pounds (View shipping rates and policies)
  • Average Customer Review: 5.0 out of 5 stars  See all reviews (1 customer review)
  • Amazon Best Sellers Rank: #276,044 in Books (See Top 100 in Books)

Editorial Reviews

Review

From the reviews:

“To describe in 18 chapters the current status in a wide field, a dazzling list of no less than 44 distinguished authors has been assembled.  Fortunately, the role of the editors has continued well beyond the point of producing their own chapters to ensure that these different contributions are reasonably well integrated with a useful index….The editors’ assertion that the experiment of focusing a beam of electrons down to an atomic scale and measuring its scattering has spectacular outcomes is most abundantly proved here.”

--Archie Howie, Microscopy and Microanalysis

“The book opens with a magnificent 90-page history of STEM by S.J. Pennycook, which traces the story of the instrument from von Ardenne’s microscope of the late 1930s to such very recent innovations as the confocal mode of operation. … Very readable, lavishly illustrated and extremely thorough, this will remain a key publication on the history of the STEM.” (Ultramicroscopy, Vol. 116, 2012)

From the Back Cover

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the editors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy: Imaging and Analysis provides a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the history of the field, the instrument, image formation and scattering theory, as well as practical aspects of imaging and analysis. The authors present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, and nanoscience. Therefore this is a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

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Most Helpful Customer Reviews

5 of 5 people found the following review helpful By TA on June 6, 2011
Format: Hardcover Verified Purchase
I own a dozen TEM books, and I must say this is the most comprehensive STEM book that I have. The book reviews the history of STEM first, and then goes over basics of STEM imaging, the Ronchigram, simulation/image interpretation, EELS and EDS. The book also covers various applications of STEM and Cs-corrected STEM to materials characterization with plenty of newest data. Leading microscopists contributed to the book. I wish that the book had a chapter on principles of Cs correction. ..the book discusses very little about Cs correction.
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