This authoritative volume, ideal for use in the laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy--together in one convenient volume. Clear and concise explanations coupled with instructive diagrams and photographs guide you through microscope operation, image production, analytical techniques, and potential applications to various disciplines. Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens. Since each laboratory has its own procedures, this unique book covers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity--and filled with helpful diagrams, photographs, and drawings--this text offers the best introduction to scanning and transmission electron microscopy available. Due to its comprehensive coverage, the book will serve as an ideal course text in the electron microscopy classes organized for the benefit of advanced students in both the biological and physical sciences.
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Book Description
Editorial Reviews
Review
"Excellent basic book on electron microscopy....Concepts are easy to understand."--Yolande Berta, Georgia Institute of Technology
"Presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Explanations coupled with diagrams and photographs guide the reader." --Journal of Chemical Education
About the Author
Stanley L. Flegler, John W. Heckman, Jr., and Karen L. Klomparens are at the Center for Electron Optics at Michigan State University.
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5.0 out of 5 stars
simple concepts, great summary,
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This review is from: Scanning and Transmission Electron Microscopy: An Introduction (Hardcover)
This is a great introductory book to understand the basic principles of electron microscopy. It contains everything you need to know as a user including vacuum pumping, electron generation, lens operation, and sample preparation.
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3.0 out of 5 stars
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This review is from: Scanning and Transmission Electron Microscopy: An Introduction (Hardcover)
When the listed "used SEM text" finally arrived, it was in almost new condition. However, I did not receive the book in the mail for over two weeks after I bought it. I am VERY disappointed because it took an entire WEEK for it to ship after I ordered it. Much much too long! I would not order from this source again.
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Inside This Book
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First Sentence:
The 1986 Nobel Prize in Physics was awarded jointly to Ernst Ruska, Gerd Binnig, and Heinrich Rohrer. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
analytical spatial resolution, tungsten gun, critical excitation energy, biological sample preparation, charging artifacts, ultrarapid freezing, vapor fixation, electron channeling, final aperture, ion thinning, most biological samples, using backscattered electrons, secondary fixation, takeoff angle, backing pump, sputter coater, ultrathin sectioning, intermediate lens, inelastically scattered electrons, electron lenses, average atomic number, thermocouple gauge, escape peaks, backscattered electron image, gun chamber Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Scanning Electron Microsc, Further Reading, Scanning Microsc, Electron Micrographic Techniques, Academic Press, Nobel Prize, Theory of Operation, Electron Microscopy Society of America, Van Nostrand Reinhold, Biological Electron Microscopy, Materials Scientists, Metals Park, University Park Press New!
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Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
The 1986 Nobel Prize in Physics was awarded jointly to Ernst Ruska, Gerd Binnig, and Heinrich Rohrer. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
analytical spatial resolution, tungsten gun, critical excitation energy, biological sample preparation, charging artifacts, ultrarapid freezing, vapor fixation, electron channeling, final aperture, ion thinning, most biological samples, using backscattered electrons, secondary fixation, takeoff angle, backing pump, sputter coater, ultrathin sectioning, intermediate lens, inelastically scattered electrons, electron lenses, average atomic number, thermocouple gauge, escape peaks, backscattered electron image, gun chamber Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Scanning Electron Microsc, Further Reading, Scanning Microsc, Electron Micrographic Techniques, Academic Press, Nobel Prize, Theory of Operation, Electron Microscopy Society of America, Van Nostrand Reinhold, Biological Electron Microscopy, Materials Scientists, Metals Park, University Park Press New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 26
books:
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1
book
cites this book:
- Scanning Electron Microscopy and X-ray Microanalysis by Joseph Goldstein on 4 pages
- Practical Electron Microscopy for Biologists by Geoffrey A. Meek on page 10, page 46, and page 64
- Introduction to Electron Microscopy by Saul Wischnitzer on page 11, and page 96
- Ultrastructure Techniques for Microorganisms by H.C. Aldrich on page 150, and page 169
- Principles and Techniques of Scanning Electron Microscopy, Vol. 3 by M. Arif Hayat on page 170, and page 171
See all 26 books this book cites
- Free Radical and Antioxidant Protocols (Methods in Molecular Biology) by Donald Armstrong on page 424
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