Secondary Ion Mass Spectrometry SIMS XI [Hardcover]

G. Gillen (Editor), R. Lareau (Editor), J. Bennett (Editor), F. Stevie (Editor), Edited by: G. Gillen (Author)

Book Description

Publication Date: February 12, 1998 | ISBN-10: 0471978264 | ISBN-13: 978-0471978268 | Edition: 1

This volume contains 252 contributions presented as plenary, invited and contributed poster and oral presentations at the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI) held at the Hilton Hotel, Walt Disney World Village, Orlando, Florida, 7 12 September, 1997. The book covers a diverse range of research, reflecting the rapid growth in advanced semiconductor characterization, ultra shallow depth profiling, TOF-SIMS and the new areas in which SIMS techniques are being used, for example in biological sciences and organic surface characterization. Papers are presented under the following categories:
* Isotopic SIMS
* Biological SIMS
* Semiconductor Characterization Techniques and Applications
* Ultra Shallow Depth Profiling
* Depth Profiling Fundamental/Modelling and Diffusion
* Sputter-Induced Topography
* Fundamentals of Molecular Desorption
* Organic Materials
* Practical TOF-SIMS
* Polyatomic Primary Ions
* Materials/Surface Analysis
* Postionization
* Instrumentation
* Geological SIMS
* Imaging
* Fundamentals of Sputtering
* Ion Formation and Cluster Formation
* Quantitative Analysis Environmental/Particle Characterization
* Related Techniques
These proceedings provide an invaluable source of reference for both newcomers to the field and experienced SIMS users.

Editorial Reviews

From the Publisher

This volume contains 252 contributions presented as plenary, invited and contributed poster and oral presentations at the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI) held at the Hilton Hotel, Walt Disney World Village, Orlando, Florida, September, 1997. The book covers a diverse range of research, reflecting the rapid growth in advanced semiconductor characterization, ultra shallow depth profiling TOF-SIMS and the new areas in which SIMS techniques are being used, for example in biological sciences and organic surface characterization.

From the Back Cover

This volume contains 252 contributions presented as plenary, invited and contributed poster and oral presentations at the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI) held at the Hilton Hotel, Walt Disney World Village, Orlando, Florida, 7?12 September, 1997. The book covers a diverse range of research, reflecting the rapid growth in advanced semiconductor characterization, ultra shallow depth profiling, TOF-SIMS and the new areas in which SIMS techniques are being used, for example in biological sciences and organic surface characterization. Papers are presented under the following categories:

• Isotopic SIMS
• Biological SIMS
• Semiconductor Characterization Techniques and Applications
• Ultra Shallow Depth Profiling
• Depth Profiling Fundamental/Modelling and Diffusion
• Sputter-Induced Topography
• Fundamentals of Molecular Desorption
• Organic Materials
• Practical TOF-SIMS
• Polyatomic Primary Ions
• Materials/Surface Analysis
• Postionization
• Instrumentation
• Geological SIMS
• Imaging
• Fundamentals of Sputtering
• Ion Formation and Cluster Formation
• Quantitative Analysis Environmental/Particle Characterization
• Related Techniques

These proceedings provide an invaluable source of reference for both newcomers to the field and experienced SIMS users.

Product Details

• Hardcover: 1150 pages
• Publisher: Wiley; 1 edition (February 12, 1998)
• Language: English
• ISBN-10: 0471978264
• ISBN-13: 978-0471978268
• Product Dimensions: 9.3 x 6.2 x 2.2 inches
• Shipping Weight: 3.2 pounds (View shipping rates and policies)
• Average Customer Review: 5.0 out of 5 stars  See all reviews (3 customer reviews)
• Amazon Best Sellers Rank: #4,538,198 in Books (See Top 100 in Books)

Customer Reviews

Most Helpful Customer Reviews

5.0 out of 5 stars Good reference, August 1, 2000

By A Customer

This review is from: Secondary Ion Mass Spectrometry SIMS XI (Hardcover)

Excellent reference book covering the state of the art in SIMS. Should be required reading for surface scientists

5.0 out of 5 stars I am just waiting for the next edition featuring David Ward, June 25, 1999

By A Customer

This review is from: Secondary Ion Mass Spectrometry SIMS XI (Hardcover)

This one is great but SIMS XIII features the awesome and inspiring David Ward. David Ward is man of the century! His valuble insight into the energy density of substrates as they pertain to polyatomic induced desorption will captivate every audience.

0 of 1 people found the following review helpful:

5.0 out of 5 stars I am just waiting for the next edition featuring David Ward, June 25, 1999

By A Customer

This review is from: Secondary Ion Mass Spectrometry SIMS XI (Hardcover)

This one is great but SIMS XII features the awesome and inspiring David Ward. David Ward is man of the century! His valuble insight into the energy density of substrates as they pertain to polyatomic induced desorption will captivate every audience.