The proceedings of the Eighth International Conference on Secondary Ion Mass Spectrometry was held in Amsterdam, September 15-20, 1991. Contains over 200 contributions by international experts in their respective fields regarding the recent progress in analytical applications, instrument development and understanding the secondary ion formation and emission processes. Coverage includes techniques for extremely sensitive quantitative element analysis with high lateral and depth resolution, increasing SIMS application to molecular and, in particular, organic materials and much more.
FREE Two-Day Shipping for students on millions of items. Learn more |
Book Description
Product Details
Would you like to update product info or give feedback on images?
|
Customer Reviews
|
There are no customer reviews yet.
|
|||
|
Video reviews
|
Tag this product(What's this?)Think of a tag as a keyword or label you consider is strongly related to this product.
Tags will help all customers organize and find favorite items. |
Sell a Digital Version of This Book in the Kindle Store
If you are a publisher or author and hold the digital rights to a book, you can sell a digital version of it in our Kindle Store.
Learn more
Customer Discussions
|
This product's forum
Active discussions in related forums
Search Customer Discussions
|
Related forums
|
