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Semiconductor Material and Device Characterization Hardcover – January 30, 2006

ISBN-13: 978-0471739067 ISBN-10: 0471739065 Edition: 3rd

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Product Details

  • Hardcover: 800 pages
  • Publisher: Wiley-IEEE Press; 3 edition (January 30, 2006)
  • Language: English
  • ISBN-10: 0471739065
  • ISBN-13: 978-0471739067
  • Product Dimensions: 8.7 x 5.5 x 1.6 inches
  • Shipping Weight: 2.6 pounds (View shipping rates and policies)
  • Average Customer Review: 5.0 out of 5 stars  See all reviews (6 customer reviews)
  • Amazon Best Sellers Rank: #403,073 in Books (See Top 100 in Books)

Editorial Reviews

Review

"I strongly recommend this book for those who want to learn device characterization." (IEEE Circuits & Devices Magazine, November/December 2006)

From the Publisher

The first book devoted to modern techniques of semiconductor characterization, this comprehensive guide to semiconductor measurement methods is detailed enough for a two-term graduate course. Organized for quick access so that it can be used as a handbook of specific characterization techniques. Processes are characterized through the use of test structures and the main techniques used within the semiconductor industry are thoroughly explained. While the majority of the book is devoted to widely used electrical characterization methods, the more specialized optical, chemical and physical methods are also covered. Contains over 1,300 references. --This text refers to an out of print or unavailable edition of this title.

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4 of 4 people found the following review helpful By M. J. Marinella on July 7, 2006
Format: Hardcover
This is an essential text for engineers, scientists, and graduate students working in the semiconductor field. It contains a thorough review of all major electrical, optical, and physical characterization methods that are commonly used. Descriptions of techniques are generally conceptually oriented, clearly stated, and do not rely excessively on equations. In addition, many useful figures are included to help explain concepts when introduced. Up to date references are included for essentially every technique mentioned.
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4 of 4 people found the following review helpful By Patrick Wellenius on May 17, 2004
Format: Hardcover
Schroder has compiled an extensive and very nearly complete guide to modern characterization techniques that apply mostly to semiconductors and solid state devices, but also to techniques used in general materials analysis. We used this text in a graduate level course in EE and found it easy to read through and concise for use as a quick reference. Well worth the money.
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Format: Hardcover
This book simply is the bible of device characterization. No matter if you are an undergrad student or a post-doc researcher this book is a must to have in your arsenal. The text has been put together in a very smooth way that makes it easy to understand the concepts and ideas. If you need more complex understanding you can always refer to the reference list at the end of each chapter. This book is the culmination of years of authors' research and completely trustworthy.

The copy of the book that I have is the D.K.Schroder's personal copy that he was having himself. I was his last graduate student when he passed away in 2012.
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