Engineering & Transportation
Semiconductor Material and Device Characterization and over one million other books are available for Amazon Kindle. Learn more

Sorry, this item is not available in
Image not available for
Color:
Image not available

To view this video download Flash Player

 


or
Sign in to turn on 1-Click ordering
Sell Us Your Item
For a $49.39 Gift Card
Trade in
More Buying Choices
Have one to sell? Sell yours here
Start reading Semiconductor Material and Device Characterization on your Kindle in under a minute.

Don't have a Kindle? Get your Kindle here, or download a FREE Kindle Reading App.

Semiconductor Material and Device Characterization [Hardcover]

Dieter K. Schroder
5.0 out of 5 stars  See all reviews (6 customer reviews)

List Price: $192.00
Price: $136.26 & FREE Shipping. Details
You Save: $55.74 (29%)
o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o
Only 8 left in stock (more on the way).
Ships from and sold by Amazon.com. Gift-wrap available.
Want it Tuesday, July 15? Choose One-Day Shipping at checkout. Details
Free Two-Day Shipping for College Students with Amazon Student

Formats

Amazon Price New from Used from
Kindle Edition $129.45  
Hardcover $136.26  
Paperback --  
China
Engineering & Transportation Books
Discover books for all types of engineers, auto enthusiasts, and much more. Learn more

Book Description

January 30, 2006 0471739065 978-0471739067 3
This Third Edition updates a landmark text with the latest findings

The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques.

Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including:

  • Updated and revised figures and examples reflecting the most current data and information
  • 260 new references offering access to the latest research and discussions in specialized topics
  • New problems and review questions at the end of each chapter to test readers' understanding of the material

In addition, readers will find fully updated and revised sections in each chapter.

Plus, two new chapters have been added:

  • Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy.
  • Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge.

Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials.

An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.


Frequently Bought Together

Semiconductor Material and Device Characterization + Physics of Semiconductor Devices + Semiconductor Device Fundamentals
Price for all three: $451.35

Buy the selected items together


Editorial Reviews

Review

"I strongly recommend this book for those who want to learn device characterization." (IEEE Circuits & Devices Magazine, November/December 2006)

From the Publisher

The first book devoted to modern techniques of semiconductor characterization, this comprehensive guide to semiconductor measurement methods is detailed enough for a two-term graduate course. Organized for quick access so that it can be used as a handbook of specific characterization techniques. Processes are characterized through the use of test structures and the main techniques used within the semiconductor industry are thoroughly explained. While the majority of the book is devoted to widely used electrical characterization methods, the more specialized optical, chemical and physical methods are also covered. Contains over 1,300 references. --This text refers to an out of print or unavailable edition of this title.

Product Details

  • Hardcover: 800 pages
  • Publisher: Wiley-IEEE Press; 3 edition (January 30, 2006)
  • Language: English
  • ISBN-10: 0471739065
  • ISBN-13: 978-0471739067
  • Product Dimensions: 8.7 x 5.5 x 1.6 inches
  • Shipping Weight: 2.6 pounds (View shipping rates and policies)
  • Average Customer Review: 5.0 out of 5 stars  See all reviews (6 customer reviews)
  • Amazon Best Sellers Rank: #366,194 in Books (See Top 100 in Books)

More About the Author

Discover books, learn about writers, read author blogs, and more.

Customer Reviews

5.0 out of 5 stars
(6)
5.0 out of 5 stars
4 star
0
3 star
0
2 star
0
1 star
0
Share your thoughts with other customers
Most Helpful Customer Reviews
4 of 4 people found the following review helpful
5.0 out of 5 stars Essential text July 7, 2006
Format:Hardcover
This is an essential text for engineers, scientists, and graduate students working in the semiconductor field. It contains a thorough review of all major electrical, optical, and physical characterization methods that are commonly used. Descriptions of techniques are generally conceptually oriented, clearly stated, and do not rely excessively on equations. In addition, many useful figures are included to help explain concepts when introduced. Up to date references are included for essentially every technique mentioned.
Comment | 
Was this review helpful to you?
4 of 4 people found the following review helpful
5.0 out of 5 stars Great reference May 17, 2004
Format:Hardcover
Schroder has compiled an extensive and very nearly complete guide to modern characterization techniques that apply mostly to semiconductors and solid state devices, but also to techniques used in general materials analysis. We used this text in a graduate level course in EE and found it easy to read through and concise for use as a quick reference. Well worth the money.
Comment | 
Was this review helpful to you?
5.0 out of 5 stars The bible of device characterization October 31, 2013
By Arash
Format:Hardcover
This book simply is the bible of device characterization. No matter if you are an undergrad student or a post-doc researcher this book is a must to have in your arsenal. The text has been put together in a very smooth way that makes it easy to understand the concepts and ideas. If you need more complex understanding you can always refer to the reference list at the end of each chapter. This book is the culmination of years of authors' research and completely trustworthy.

The copy of the book that I have is the D.K.Schroder's personal copy that he was having himself. I was his last graduate student when he passed away in 2012.
Comment | 
Was this review helpful to you?




What Other Items Do Customers Buy After Viewing This Item?


Forums

There are no discussions about this product yet.
Be the first to discuss this product with the community.
Start a new discussion
Topic:
First post:
Prompts for sign-in
 



Look for Similar Items by Category