Discusses process variation, model accuracy, design flow and many other practical engineering, reliability and manufacturing issues Gives a good overview for a person who is not an expert in modeling and simulation, enabling them to extract the necessary information to competently use modeling and simulation programs Written for engineering students and product design engineers
Semiconductor Modeling
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Editorial Reviews
From the Back Cover
Semiconductor Modeling: For Simulating Signal, Power, and Electromagnetic Integrity gives designers and engineers a broad view of using semiconductor models to design high-speed circuit boards. Most issues in the field of designing high-frequency circuits, from the beginning of modeling and simulation using EDA tools to future trends, are discussed and integrated. The main technical focus of Semiconductor Modeling: For Simulating Signal, Power, and Electromagnetic Integrity is the use of simulation to help solve practical engineering problems. The book draws on over 90 years of diverse technical experience and brings together theory, tools, components, software, and experience to help engineers create successful electronic products. This book will help engineers understand how to approach problem solving while designing high-speed circuits. In particular, it helps engineers in the following areas: · Encountering non-existent, incomplete, and erroneous semiconductor circuit models. · Applying EDA tools to achieve practical designs despite model limitations. · Grasping the basic high-speed digital, RF, and EMC design concepts that guide design intent. · Applying EDA tools to cutting-edge digital technology. · Working with suppliers, CAD team members, and others. · Understanding the processes and procedures that enable and enhance the design process. The book presents the material in a manner that is helpful to circuit and product design engineers who have little or no specialized knowledge of high-speed digital design or semiconductors.
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Most Helpful Customer Reviews
2 of 2 people found the following review helpful:
4.0 out of 5 stars
Broadest Coverage of IBIS,
This review is from: Semiconductor Modeling:: For Simulating Signal, Power, and Electromagnetic Integrity (Hardcover)
This book provides a very readable and excellent resource for several modeling approaches needed in advanced design. It includes the broadest coverage to date of all aspects of the IBIS Standard, now well-established in industry. Formal syntactical topics are included along with important practical concerns of model quality and proper usage.
Connecting IBIS with other modeling formats and methods works well and preserves continuity in addressing multiple design issues. So this book is very valuable addition to one's library.
1 of 1 people found the following review helpful:
4.0 out of 5 stars
latest simulation ideas,
By
This review is from: Semiconductor Modeling:: For Simulating Signal, Power, and Electromagnetic Integrity (Hardcover)
The book offers the latest ideas in more accurate simulations of circuits laid down in semiconductors. The emphasis is at a level above basic device physics simulations. The latter is not really dealt with much. Instead, a reader who might be an electrical engineer needs to design at larger scales of a circuit.
You get a discussion of how to use the latest EDA tools. But note that the book is not confined to simulations. One key issue is how to compare simulations against actual measurements taken from live circuits. The IBIS model is also a major portion of the text. Knowledge of how to use IBIS is now often as necessary as knowing SPICE, for many engineers.
0 of 1 people found the following review helpful:
1.0 out of 5 stars
Ba-a-a-a-ad!,
By
Amazon Verified Purchase(What's this?)
This review is from: Semiconductor Modeling:: For Simulating Signal, Power, and Electromagnetic Integrity (Hardcover)
Probably the WORST book I've purchased since I graduated from MIT 48 years ago.
Reads like a novel... all BS and no meat :-( Implies definitive IBIS, but lots of superfluous ANCIENT modeling. Sheeeesh!
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Inside This Book
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Key Phrases - Statistically Improbable Phrases (SIPs):
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ibis specification, ibis file, signal integrity engineer, radiated field terms, pin parasitics, device physics models, overlay metric, email reflector, encrypted models, circuit simulator models, shows collector characteristics, collector characteristic curves, die capacitance, shows gain bandwidth, clamp curves, signal integrity simulation, clamp reference, falling waveform, power clamp, semiconductor modeling, semiconductor supplier, settle delay, company part number, input threshold voltage, pin list Key Phrases - Capitalized Phrases (CAPs): (learn more)
Ohm's Law, Circuit Call, Cadence Design Systems, Diff Pin, File Rev, Fairchild Semiconductor, Keyword Description Required, Node Declarations, Scattering Parameters, Using Data Sheets, Add Submodel, Golden Waveforms, Using Laboratory Measurements, Examination of Figures, Systems Integrator, Buffer Accuracy Handbook, Component Librarian, Measuring Model Properties, Model Selector, Parameter Name Parameter Description Starting, Series Current, Smith Chart, Table Notes, Corner Max, Corner Min New!
Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
ibis specification, ibis file, signal integrity engineer, radiated field terms, pin parasitics, device physics models, overlay metric, email reflector, encrypted models, circuit simulator models, shows collector characteristics, collector characteristic curves, die capacitance, shows gain bandwidth, clamp curves, signal integrity simulation, clamp reference, falling waveform, power clamp, semiconductor modeling, semiconductor supplier, settle delay, company part number, input threshold voltage, pin list Key Phrases - Capitalized Phrases (CAPs): (learn more)
Ohm's Law, Circuit Call, Cadence Design Systems, Diff Pin, File Rev, Fairchild Semiconductor, Keyword Description Required, Node Declarations, Scattering Parameters, Using Data Sheets, Add Submodel, Golden Waveforms, Using Laboratory Measurements, Examination of Figures, Systems Integrator, Buffer Accuracy Handbook, Component Librarian, Measuring Model Properties, Model Selector, Parameter Name Parameter Description Starting, Series Current, Smith Chart, Table Notes, Corner Max, Corner Min New!
Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
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