Key Phrases - Statistically Improbable Phrases (SIPs):
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graded channel approximation, neighboring readout channels, biassing structures, movable charge carriers, undepleted bulk, diode strip detector, same technological steps, basic semiconductor structures, excess generation rate, strip implant, capacitive charge division, serial noise, full depletion voltage, unbiased diode, clear electrode, readout function, readout electrode, reverse annealing, readout pitch, field effect transistor structure, bare oxide, defect energy level, strip detectors, readout strips, wafer irradiated
Key Phrases - Capitalized Phrases (CAPs):
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The Electronics of the Readout Function, After Sze, Operating Principles of Transistors, Front-End Systems, After Wunstorf, Depleted Field Effect Transistor Structure, Numerical Solution of Stationary Situations, After Strüder, After Kemmer, Basic Electronic Circuits, Detector-Technology-Compatible Electronics, Properties of Extrinsic Semiconductor Materials, After Gatti, Choice of Detector Material
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