Key Phrases - Statistically Improbable Phrases (SIPs):
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gas stream direction, micropipe closing, doping gas concentration, projected probability distribution, relevant charge states, cubic inclusions, basal plane dislocations, silicon vacancy, horizontal hot wall reactor, positron trapping rate, crystals containing stacking faults, wafer warp, bulk electron mobility, terrace nucleation, sic precipitates, silicon self diffusion, incident positron energy, inequivalent lattice sites, substrate bilayer, carbon vacancy, crystal halves, hall effect analysis, high channel mobility, stacking fault formation, band gap states
Key Phrases - Capitalized Phrases (CAPs):
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Electron Devices, New York, Status Solidi, Electron Device Lett, Materials Research Society, Solid-State Electronics, Device Research Conference, Materials Science Forum, Trans Tech Publications, Fall Meeting, International Conference, International Symp, Academic Press, Cree Inc, Diamond Relat, European Conference, Glenn Research Center, Introduction Silicon, Plenum Press, Springer Proceedings, Electrochemical Soc, Electron Nlicrosc, Institute of Physics Publishing, Insulated-Gate Bipolar Transistor, Swedish Research Council
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