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ESD in Silicon Integrated Circuits
 
 
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ESD in Silicon Integrated Circuits [Hardcover]

E. Ajith Amerasekera (Author), Charvaka Duvvury (Author)
3.5 out of 5 stars  See all reviews (2 customer reviews)

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Book Description

0471498718 978-0471498711 May 15, 2002 2
* Examines the various methods available for circuit protection, including coverage of the newly developed ESD circuit protection schemes for VLSI circuits.
* Provides guidance on the implementation of circuit protection measures.
* Includes new sections on ESD design rules, layout approaches, package effects, and circuit concepts.
* Reviews the new Charged Device Model (CDM) test method and evaluates design requirements necessary for circuit protection.

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Editorial Reviews

From the Publisher

This comprehensive reference explains the practical aspects of electrostatic discharge (ESD) and its implications in the design and development of new technologies and integrated circuits. Emphasizes the key issues of reliability and test methods to evaluate protection circuit performance. Various case studies illustrate the effects of diverse design approaches and the full effectiveness of a protection circuit is realized through stress analysis. Concludes with a summary of cutting-edge techniques and prospective future developments. --This text refers to an out of print or unavailable edition of this title.

From the Back Cover

As high density circuits move deeper into submicron dimensions Electrostatic Discharge (ESD) effects become an increasing concern. This new edition of a classic reference presents a practical and systematic approach to ESD device physics, modelling and design techniques. The authors draw upon their wealth of industrial experience to provide a complete overview of ESD and its implications in the development of advanced integrated circuits.

Fully revised to incorporate the latest industry achievements and featuring:
* Design methods for a variety of technologies from 1 micron to the current sub-micron regimes, along with complete design approaches for MOS, BiCMOS and Power MOSFETs.

* New sections on ESD design rules, process technology effects, layout approaches, package effects and circuit simulations.

* Guidance on the implementation of circuit protection measures for a range of I/O configurations.

* Detailed coverage of ESD simulation stress models.
This unique reference provides the means to design protection circuits for a variety of applications and to diagnose and solve ESD problems in IC products. The coverage of state-of-the-art circuit design for ESD prevention will appeal to engineers and scientists working in the fields of IC and transistor design. Graduate students and researchers in device/circuit modeling and semiconductor reliability will appreciate this comprehensive coverage of ESD fundamentals.

Product Details

  • Hardcover: 422 pages
  • Publisher: Wiley; 2 edition (May 15, 2002)
  • Language: English
  • ISBN-10: 0471498718
  • ISBN-13: 978-0471498711
  • Product Dimensions: 7 x 1.2 x 9.7 inches
  • Shipping Weight: 1.6 pounds (View shipping rates and policies)
  • Average Customer Review: 3.5 out of 5 stars  See all reviews (2 customer reviews)
  • Amazon Best Sellers Rank: #2,305,817 in Books (See Top 100 in Books)

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3.5 out of 5 stars (2 customer reviews)
 
 
 
 
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3.0 out of 5 stars ESD Control, February 19, 2008
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This review is from: ESD in Silicon Integrated Circuits (Hardcover)
I had this book when in relation to my studies in ESD control. This book however, deals more with the mathematical description of ESD protection on circuits and ESD protection in the design of circuits. It was a little bit too theoritical for my needs at that time, since I was more incline on materials dealing with EPA design and ESD management.
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5 of 13 people found the following review helpful:
4.0 out of 5 stars It's good for you who are interested in ESD.., October 28, 2000
By 
Eun-Gu Jung (Kwang-ju South Korea) - See all my reviews
Recently, I studied the CMOS layout. And I attended at the project about that. I fel the need to know the ESD phenomeon. At that time, I found this book. I understood this phenomenon and the ways to protect it easily. Because the book provided many graphs and photos and it treated the phenomenon in depth relatively. But this book didn't deal with the antenna diode issues. The importance of the antenna diode issues increases. So I hope that the authers will publish new edition.

On the whole, I am satisfied with this book.

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Inside This Book (learn more)
First Sentence:
The phenomenon of electrostatic discharge (ESD) gives rise to images of lightning strikes or the sparks that leap from one's fingertips when touching a doorknob in dry winter. Read the first page
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Electron Dev, Electron Der, Human Body Model, New York, Symposium Proceedings, John Wiley, Shaker Verlag, Solid State Electr, Component Level, Vss Output, Physics of Semiconductor Devices, Semiconductor Power Devices, Vddio Input, Automotive Electronics Council, Capacitive Test Structures, Circuits Which Need, Dead Bug, Device Lett, Harsh Environments of Automotive, Influence of Gate Length, Kluwer Academic Publishers, Model of Leakage Current, Output Circuitry, Solid State Technology Association, The Physics of Instabilities
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